Henry Pang

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Foster City, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Determination of customized components for fitting wafer profile
- Patent number 11,788,833
- Issue date Oct 17, 2023
- Nikon Corporation
- Travis D. Bow
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic thermal distortion compensation with the use of machin...
- Patent number 10,990,024
- Issue date Apr 27, 2021
- Nikon Research Corporation of America
- Travis Bow
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Determination of customized components for fitting wafer profile
- Patent number 10,718,606
- Issue date Jul 21, 2020
- Nikon Corporation
- Travis D. Bow
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic thermal distortion compensation with the use of machin...
- Patent number 10,444,643
- Issue date Oct 15, 2019
- Nikon Research Corporation of America
- Travis Bow
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
DETERMINATION OF CUSTOMIZED COMPONENTS FOR FITTING WAFER PROFILE
- Publication number 20200292304
- Publication date Sep 17, 2020
- Nikon Corporation
- Travis D. Bow
- G01 - MEASURING TESTING
Information Patent Application
LITHOGRAPHIC THERMAL DISTORTION COMPENSATION WITH THE USE OF MACHIN...
- Publication number 20200096872
- Publication date Mar 26, 2020
- Nikon Research Corporation of America
- Travis Bow
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LITHOGRAPHIC THERMAL DISTORTION COMPENSATION WITH THE USE OF MACHIN...
- Publication number 20180275525
- Publication date Sep 27, 2018
- Nikon Research Corporation of America
- Travis Bow
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DETERMINATION OF CUSTOMIZED COMPONENTS FOR FITTING WAFER PROFILE
- Publication number 20160305772
- Publication date Oct 20, 2016
- Nikon Corporation
- Travis D. Bow
- G01 - MEASURING TESTING