Henry Y. Pun

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit tester with compensation for leakage current
- Patent number 6,194,911
- Issue date Feb 27, 2001
- Credence Systems Corporation
- Jeffrey D. Currin
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit tester with test head including regulating capac...
- Patent number 6,087,843
- Issue date Jul 11, 2000
- Credence Systems Corporation
- Henry Yu-Hing Pun
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit tester with compensation for leakage current
- Patent number 5,999,008
- Issue date Dec 7, 1999
- Credence Systems Corporation
- Jeffrey D. Currin
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit tester including at least one quasi-autonomous t...
- Patent number 5,930,735
- Issue date Jul 27, 1999
- Credence Systems Corporation
- Henry Y. Pun
- G01 - MEASURING TESTING