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Herbert P. Byrnes
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Poughkeepsie, NY, US
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last 30 patents
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Patent Grant
Thin interface pellicle for dense arrays of electrical interconnects
Patent number
5,207,585
Issue date
May 4, 1993
International Business Machines Corporation
Herbert P. Byrnes
G01 - MEASURING TESTING
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Patent Grant
Dual-mode Z-stage
Patent number
5,150,040
Issue date
Sep 22, 1992
International Business Machines Corporation
Herbert P. Byrnes
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Contact probe assembly having rotatable contacting probe elements
Patent number
4,423,376
Issue date
Dec 27, 1983
International Business Machines Corporation
Herbert P. Byrnes
G01 - MEASURING TESTING
Information
Patent Grant
Contact for an electrical contactor assembly
Patent number
4,027,935
Issue date
Jun 7, 1977
International Business Machines Corporation
Herbert P. Byrnes
G01 - MEASURING TESTING