Herbert TSAI

Person

Taoyuan County, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Test system with rotational test arms for testing semiconductor com...
- Patent number 9,638,740
- Issue date May 2, 2017
- CHROMA ATE INC.
- Chien-Ming Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing system-in-package devices
- Patent number 7,545,158
- Issue date Jun 9, 2009
- Chroma Ate Inc.
- James E. Hopkins
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for testing system-in-package devices
- Patent number 7,535,214
- Issue date May 19, 2009
- Chroma Ate Inc.
- James E. Hopkins
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuits of an apparatus for testing micro SD devices
- Patent number 7,518,357
- Issue date Apr 14, 2009
- Chroma Ate Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing system-in-package devices
- Patent number 7,518,356
- Issue date Apr 14, 2009
- Chroma Ate Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Grant
Test circuits of an apparatus for testing system-in-package devices
- Patent number 7,514,914
- Issue date Apr 7, 2009
- Chroma Ate Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing micro SD devices using test circuits
- Patent number 7,489,156
- Issue date Feb 10, 2009
- Chruma Ate Inc.
- James E. Hopkins
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing plurality of system-in-package devices using plu...
- Patent number 7,489,155
- Issue date Feb 10, 2009
- Chroma Ate Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing micro SD devices using each test circuits
- Patent number 7,443,190
- Issue date Oct 28, 2008
- Chroma Ate Inc.
- James E. Hopkins
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TEST SYSTEM WITH ROTATIONAL TEST ARMS FOR TESTING SEMICONDUCTOR COM...
- Publication number 20140103954
- Publication date Apr 17, 2014
- CHROMA ATE INC.
- Chien-Ming CHEN
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for testing system-in-package devices
- Publication number 20080252312
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
Method for testing micro SD devices
- Publication number 20080252323
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for testing system-in-package devices
- Publication number 20080252319
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for testing micro SD devices
- Publication number 20080252321
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
Method for testing system-in-package devices
- Publication number 20080252313
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for testing system-in-package devices
- Publication number 20080252314
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for testing system-in-package devices
- Publication number 20080252317
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for testing micro SD devices
- Publication number 20080252320
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
Method for testing system-in-package devices
- Publication number 20080252322
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING MICRO SD DEVICES USING EACH TEST CIRCUITS
- Publication number 20080252318
- Publication date Oct 16, 2008
- Semiconductor Testing Advanced Research Lab Inc.
- James E. Hopkins
- G01 - MEASURING TESTING

Herbert TSAI

Person

Patents Grantslast 30 patents

Test system with rotational test arms for testing semiconductor com...

Method for testing system-in-package devices

Apparatus for testing system-in-package devices

Test circuits of an apparatus for testing micro SD devices

Apparatus for testing system-in-package devices

Test circuits of an apparatus for testing system-in-package devices

Method for testing micro SD devices using test circuits

Method for testing plurality of system-in-package devices using plu...

Method for testing micro SD devices using each test circuits

Patents Applicationslast 30 patents

TEST SYSTEM WITH ROTATIONAL TEST ARMS FOR TESTING SEMICONDUCTOR COM...

Apparatus for testing system-in-package devices

Method for testing micro SD devices

Apparatus for testing system-in-package devices

Apparatus for testing micro SD devices

Method for testing system-in-package devices

Apparatus for testing system-in-package devices

Apparatus for testing system-in-package devices

Apparatus for testing micro SD devices

Method for testing system-in-package devices

METHOD FOR TESTING MICRO SD DEVICES USING EACH TEST CIRCUITS