Membership
Tour
Register
Log in
Hermann Wollnik
Follow
Person
6301 Fernwald, DE
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Parallel plate-type non-uniform electric field ion mobility spectro...
Patent number
10,184,914
Issue date
Jan 22, 2019
Shimadzu Corporation
Hermann Wollnik
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for digital differential ion mobility separation
Patent number
8,138,474
Issue date
Mar 20, 2012
Shimadzu Corporation
Hermann Wollnik
G01 - MEASURING TESTING
Information
Patent Grant
Charged-particle condensing device
Patent number
8,013,296
Issue date
Sep 6, 2011
Shimadzu Corporation
Hermann Wollnik
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for digital differential ion mobility separation
Patent number
7,863,562
Issue date
Jan 4, 2011
Shimadzu Corporation
Hermann Wollnik
G01 - MEASURING TESTING
Information
Patent Grant
“Droplet pickup ion source” coupled to mobility analyzer apparatus...
Patent number
7,772,548
Issue date
Aug 10, 2010
Shimadzu Corporation
Hermann Wollnik
G01 - MEASURING TESTING
Information
Patent Grant
Fast timing position sensitive detector
Patent number
5,644,128
Issue date
Jul 1, 1997
Ionwerks
Hermann Wollnik
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Time-of-flight mass spectrometer as the second stage for a tandem m...
Patent number
5,233,189
Issue date
Aug 3, 1993
Hermann Wollnik
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Analytical system with electrothermal atomizer and mass spectromete...
Patent number
5,191,212
Issue date
Mar 2, 1993
Spectro GmbH
Heinz Falk
G01 - MEASURING TESTING
Information
Patent Grant
Ion reflector
Patent number
5,017,780
Issue date
May 21, 1991
Roland Kutscher
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Double focusing mass spectrometer and MS/MS arrangement
Patent number
4,924,090
Issue date
May 8, 1990
Hermann Wollnik
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for generating extremely short ion pulses of high intensity...
Patent number
4,904,872
Issue date
Feb 27, 1990
Raimund Grix
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Magnetic multi-pole arrangement of the nth order
Patent number
4,633,208
Issue date
Dec 30, 1986
Siemens Aktiengesellschaft
Erich Voss
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Arrangement and process for adjusting imaging systems
Patent number
4,486,664
Issue date
Dec 4, 1984
Hermann Wollnik
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Process for the digitization and display of thermographic records
Patent number
4,445,516
Issue date
May 1, 1984
Carl Zeiss Stiftung
Hermann Wollnik
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Coil arrangement for electromagnetically influencing magnetic field...
Patent number
4,187,485
Issue date
Feb 5, 1980
Hermann Wollnik
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process and arrangement for registration of ion-, electron- and lig...
Patent number
4,164,652
Issue date
Aug 14, 1979
Varian Mat GmbH
Hermann Wollnik
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PARALLEL PLATE-TYPE NON-UNIFORM ELECTRIC FIELD ION MOBILITY SPECTRO...
Publication number
20180238831
Publication date
Aug 23, 2018
SHIMADZU CORPORATION
Hermann WOLLNIK
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR DIGITAL DIFFERENTIAL ION MOBILITY SEPARATION
Publication number
20110057094
Publication date
Mar 10, 2011
SHIMADZU CORPORATION
Hermann WOLLNIK
G01 - MEASURING TESTING
Information
Patent Application
CHARGED-PARTICLE CONDENSING DEVICE
Publication number
20100148062
Publication date
Jun 17, 2010
Shimadzu Corporation
Hermann Wollnik
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
"DROPLET PICKUP ION SOURCE" COUPLED TO MOBILITY ANALYZER APPARATUS...
Publication number
20090278036
Publication date
Nov 12, 2009
SUIMADZU CORPORATION
Hermann Wollnik
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for digital differential ion mobility separation
Publication number
20080315087
Publication date
Dec 25, 2008
Shimadzu Corporation
Hermann Wollnik
G01 - MEASURING TESTING