Hermann Wollnik

Person

Santa Fe, NM, US

People

Patents Grantslast 30 patents

Information Patent Grant
Ion source for an ion mobility spectrometer
- Patent number 10,930,485
- Issue date Feb 23, 2021
- Hamilton Sundstrand Corporation
- Benjamin D. Gardner
- G01 - MEASURING TESTING
Information Patent Grant
Time-of-flight mass spectrometer and a method of analysing ions in...
- Patent number 9,595,432
- Issue date Mar 14, 2017
- SHIMADZU CORPORATION
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion-mobility spectrometer including a decelerating ion gate
- Patent number 9,508,535
- Issue date Nov 29, 2016
- Shimadzu Corporation
- Hermann Wollnik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Curtain gas filter for mass- and mobility-analyzers that excludes i...
- Patent number 8,969,795
- Issue date Mar 3, 2015
- Shimadzu Corporation
- Hermann Wollnik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Co-axial time-of-flight mass spectrometer
- Patent number 8,952,325
- Issue date Feb 10, 2015
- Shimadzu Corporation
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Curtain gas filter for high-flux ion sources
- Patent number 8,809,775
- Issue date Aug 19, 2014
- Shimadzu Corporation
- Hermann Wollnik
- G01 - MEASURING TESTING
Information Patent Grant
Parallel plate electrode arrangement apparatus and method
- Patent number 8,067,747
- Issue date Nov 29, 2011
- Shimadzu Corporation
- Hermann Wollnik
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ION SOURCE FOR AN ION MOBILITY SPECTROMETER
- Publication number 20200312646
- Publication date Oct 1, 2020
- HAMILTON SUNDSTRAND CORPORATION
- Benjamin D. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION-MOBILITY SPECTROMETER INCLUDING A DECELERATING ION GATE
- Publication number 20150221489
- Publication date Aug 6, 2015
- Hermann Wollnik
- G01 - MEASURING TESTING
Information Patent Application
CURTAIN GAS FILTER FOR HIGH-FLUX ION SOURCES
- Publication number 20130140456
- Publication date Jun 6, 2013
- SHIMADZU CORPORATION
- Hermann Wollnik
- G01 - MEASURING TESTING
Information Patent Application
CURTAIN GAS FILTER FOR MASS- AND MOBILITY-ANALYZERS THAT EXCLUDES I...
- Publication number 20110174966
- Publication date Jul 21, 2011
- SHIMADZU CORPORATION
- Hermann Wollnik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER AND A METHOD OF ANALYSING IONS IN...
- Publication number 20100072362
- Publication date Mar 25, 2010
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CO-AXIAL TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20100072363
- Publication date Mar 25, 2010
- Roger Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARALLEL PLATE ELECTRODE ARRANGEMENT APPARATUS AND METHOD
- Publication number 20090206250
- Publication date Aug 20, 2009
- SHIMADZU CORPORATION
- Hermann Wollnik
- G01 - MEASURING TESTING

Hermann Wollnik

Person

Patents Grantslast 30 patents

Ion source for an ion mobility spectrometer

Time-of-flight mass spectrometer and a method of analysing ions in...

Ion-mobility spectrometer including a decelerating ion gate

Curtain gas filter for mass- and mobility-analyzers that excludes i...

Co-axial time-of-flight mass spectrometer

Curtain gas filter for high-flux ion sources

Parallel plate electrode arrangement apparatus and method

Patents Applicationslast 30 patents

ION SOURCE FOR AN ION MOBILITY SPECTROMETER

ION-MOBILITY SPECTROMETER INCLUDING A DECELERATING ION GATE

CURTAIN GAS FILTER FOR HIGH-FLUX ION SOURCES

CURTAIN GAS FILTER FOR MASS- AND MOBILITY-ANALYZERS THAT EXCLUDES I...

TIME-OF-FLIGHT MASS SPECTROMETER AND A METHOD OF ANALYSING IONS IN...

CO-AXIAL TIME-OF-FLIGHT MASS SPECTROMETER

PARALLEL PLATE ELECTRODE ARRANGEMENT APPARATUS AND METHOD