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Herve Fleury
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Caen, FR
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Patents Grants
last 30 patents
Information
Patent Grant
IC testing methods and apparatus
Patent number
8,327,205
Issue date
Dec 4, 2012
NXP B.V.
Tom Waayers
G01 - MEASURING TESTING
Information
Patent Grant
Method of manufacturing a system in package
Patent number
7,960,189
Issue date
Jun 14, 2011
NXP B.V.
Philippe L. L. Cauvet
G01 - MEASURING TESTING
Information
Patent Grant
Testable electronic circuit
Patent number
7,899,641
Issue date
Mar 1, 2011
NXP B.V.
Hervé Fleury
G01 - MEASURING TESTING
Information
Patent Grant
Electronic circuit comprising a secret sub-module
Patent number
7,519,496
Issue date
Apr 14, 2009
NXP B.V.
Jean-Marc Yannou
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF MANUFACTURING A SYSTEM IN PACKAGE
Publication number
20090148966
Publication date
Jun 11, 2009
NXP B.V.
Philippe L. L. Cauvet
G01 - MEASURING TESTING
Information
Patent Application
Ic Testing Methods and Apparatus
Publication number
20090003424
Publication date
Jan 1, 2009
NXP B.V.
Tom Waayers
G01 - MEASURING TESTING
Information
Patent Application
Testable Electronic Circuit
Publication number
20080133167
Publication date
Jun 5, 2008
NXP B.V.
Herve Fleury
G01 - MEASURING TESTING
Information
Patent Application
Electronic circuit comprising a secret sub-module
Publication number
20070088519
Publication date
Apr 19, 2007
Koninklijke Philips Electronics N.V.
Jean-Marc Yannou
G01 - MEASURING TESTING