Herve-William Remigy

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Method of preparing a cryogenic sample with improved cooling charac...
- Patent number 11,994,341
- Issue date May 28, 2024
- FEI Company
- Maarten Kuijper
- G01 - MEASURING TESTING
Information Patent Grant
Preparation of cryogenic sample for charged-particle microscopy
- Patent number 9,865,428
- Issue date Jan 9, 2018
- FEI Company
- Herve-William Remigy
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Preparation of sample for charged-particle microscopy
- Patent number 9,772,265
- Issue date Sep 26, 2017
- FEI Company
- Hervé-William Rémigy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Preparation of cryogenic sample for charged-particle microscopy
- Patent number 9,116,091
- Issue date Aug 25, 2015
- FEI Company
- Hervé-William Rémigy
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring the temperature of a sample carrier in a charge...
- Patent number 8,757,873
- Issue date Jun 24, 2014
- FEI Company
- Stephanus Hubertus Leonardus van den Boom
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF PREPARING A CRYOGENIC SAMPLE WITH IMPROVED COOLING CHARAC...
- Publication number 20240271850
- Publication date Aug 15, 2024
- FEI Company
- Maarten KUIJPER
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PREPARING A CRYOGENIC SAMPLE WITH IMPROVED COOLING CHARAC...
- Publication number 20220316784
- Publication date Oct 6, 2022
- FEI Company
- Maarten KUIJPER
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Application
PREPARATION OF CRYOGENIC SAMPLE FOR CHARGED-PARTICLE MICROSCOPY
- Publication number 20170169991
- Publication date Jun 15, 2017
- FEI Company
- Herve-William Remigy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PREPARATION OF SAMPLE FOR CHARGED-PARTICLE MICROSCOPY
- Publication number 20160245732
- Publication date Aug 25, 2016
- FEI Company
- Hervé-William Rémigy
- G01 - MEASURING TESTING
Information Patent Application
Preparation of Cryogenic Sample for Charged-Particle Microscopy
- Publication number 20150090878
- Publication date Apr 2, 2015
- FEI Company
- Hervé-William Rémigy
- G01 - MEASURING TESTING
Information Patent Application
Method of Measuring the Temperature of a Sample Carrier in a Charge...
- Publication number 20120128028
- Publication date May 24, 2012
- FEI Company
- Stephanus Hubertus Leonardus van den Boom
- G01 - MEASURING TESTING