Heui Jae Pahk

Person

Seoul, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Three-dimensional shape measuring device capable of measuring color...
- Patent number 9,696,144
- Issue date Jul 4, 2017
- SNU PRECISION CO., LTD.
- Tae Yong Jo
- G01 - MEASURING TESTING
Information Patent Grant
Estimating thickness based on number of peaks between two peaks in...
- Patent number 8,947,673
- Issue date Feb 3, 2015
- SNU Precision Co., Ltd.
- Heui Jae Pahk
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer for TSV measurement and measurement method using same
- Patent number 8,873,067
- Issue date Oct 28, 2014
- SNU Precision Co., Ltd.
- Ki Hun Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring thickness
- Patent number 8,279,447
- Issue date Oct 2, 2012
- SNU Precision Co., Ltd.
- Heui-Jae Pahk
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring thickness
- Patent number 8,199,332
- Issue date Jun 12, 2012
- SNU Precision Co., Ltd.
- Heui-Jae Pahk
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting input shaft of power steering system
- Patent number 7,308,130
- Issue date Dec 11, 2007
- SNU Precision Co., Ltd.
- Heui-Jae Pahk
- G01 - MEASURING TESTING
Information Patent Grant
Machine and method for inspecting ferrule of optical connector
- Patent number 7,113,273
- Issue date Sep 26, 2006
- Heui-Jae Pahk
- G01 - MEASURING TESTING
Information Patent Grant
Measurement and compensation system for thermal errors in machine t...
- Patent number 6,167,634
- Issue date Jan 2, 2001
- SNU Precision Co., Ltd.
- Heui Jae Pahk
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Non contact measuring method for three dimensional micro pattern in...
- Patent number 6,005,669
- Issue date Dec 21, 1999
- Pahk; Heui Jae
- Heui Jae Pahk
- G01 - MEASURING TESTING
Information Patent Grant
Method of assessing three dimensional volumetric errors in multiaxi...
- Patent number 5,841,668
- Issue date Nov 24, 1998
- Snu Precision Co., Ltd.
- Heui Jae Pahk
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
ANGLE-RESOLVED SPECTROSCOPIC ELLIPSOMETER USING SPATIAL LIGHT MODUL...
- Publication number 20240369473
- Publication date Nov 7, 2024
- Seoul National University R&DB Foundation
- Heui Jae PAHK
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR MEASURING THICKNESS AND PHYSICAL PROPERTIES OF THIN FILM...
- Publication number 20230266233
- Publication date Aug 24, 2023
- Seoul National University R&DB Foundation
- Heui Jae PAHK
- G01 - MEASURING TESTING
Information Patent Application
Three-Dimensional Shape Measuring Device Capable of Measuring Color...
- Publication number 20160102970
- Publication date Apr 14, 2016
- SNU Precision Co., Ltd.
- Tae Yong Jo
- G01 - MEASURING TESTING
Information Patent Application
Interferometer for TSV Measurement and Measurement Method Using Same
- Publication number 20140036273
- Publication date Feb 6, 2014
- SNU PRECISION CO. LTD.
- Ki Hun Lee
- G01 - MEASURING TESTING
Information Patent Application
Method for Measuring Thickness or Surface Profile
- Publication number 20110188048
- Publication date Aug 4, 2011
- SNU Precision Co., Ltd.
- Heui Jae Pahk
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for Measuring Thickness
- Publication number 20110001988
- Publication date Jan 6, 2011
- SNU Precision Co., Ltd.
- Heui-Jae Pahk
- G01 - MEASURING TESTING
Information Patent Application
Method for Measuring Thickness
- Publication number 20100277745
- Publication date Nov 4, 2010
- SNU Precision Co., Ltd.
- Heui-Jae Pahk
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR PROCESSING MATERIALS BY LASER BEAM
- Publication number 20100006549
- Publication date Jan 14, 2010
- SNU Precision Co., Ltd.
- Heui Jae Pahk
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Machine and method for inspecting ferrule of optical connector
- Publication number 20050041241
- Publication date Feb 24, 2005
- Heui-Jae Pahk
- G01 - MEASURING TESTING
Information Patent Application
Machine and method for inspecting input shaft of power steering system
- Publication number 20050000051
- Publication date Jan 6, 2005
- Heui-Jae Pahk
- G01 - MEASURING TESTING

Heui Jae Pahk

Person

Patents Grantslast 30 patents

Three-dimensional shape measuring device capable of measuring color...

Estimating thickness based on number of peaks between two peaks in...

Interferometer for TSV measurement and measurement method using same

Method for measuring thickness

Apparatus for measuring thickness

Method for inspecting input shaft of power steering system

Machine and method for inspecting ferrule of optical connector

Measurement and compensation system for thermal errors in machine t...

Non contact measuring method for three dimensional micro pattern in...

Method of assessing three dimensional volumetric errors in multiaxi...

Patents Applicationslast 30 patents

ANGLE-RESOLVED SPECTROSCOPIC ELLIPSOMETER USING SPATIAL LIGHT MODUL...

SYSTEM FOR MEASURING THICKNESS AND PHYSICAL PROPERTIES OF THIN FILM...

Three-Dimensional Shape Measuring Device Capable of Measuring Color...

Interferometer for TSV Measurement and Measurement Method Using Same

Method for Measuring Thickness or Surface Profile

Apparatus for Measuring Thickness

Method for Measuring Thickness

DEVICE FOR PROCESSING MATERIALS BY LASER BEAM

Machine and method for inspecting ferrule of optical connector

Machine and method for inspecting input shaft of power steering system