Heui-Jae Park

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Dark-field examination device
- Patent number 8,223,326
- Issue date Jul 17, 2012
- SNU Precision Co., Ltd.
- Tai-Wook Kim
- G01 - MEASURING TESTING
Information Patent Grant
Automatic inspection system for camera lenses and method thereof us...
- Patent number 5,726,746
- Issue date Mar 10, 1998
- Samsung Aerospace Industries, Ltd.
- Heui-Jae Park
- G01 - MEASURING TESTING
Information Patent Grant
Static random access memory with redundancy
- Patent number 5,060,197
- Issue date Oct 22, 1991
- Samsung Electronics Co., Ltd.
- Heui-Chul Park
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Apparatus for Measuring Three-Dimensional Profile Using LCD
- Publication number 20110279670
- Publication date Nov 17, 2011
- SNU Precision Co., Ltd.
- Heui-Jae Park
- G01 - MEASURING TESTING
Information Patent Application
Dark-Field Examination Device
- Publication number 20110043794
- Publication date Feb 24, 2011
- SNU Precision Co., Ltd.
- Tai-Wook Kim
- G02 - OPTICS
Information Patent Application
VISION INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME
- Publication number 20110013015
- Publication date Jan 20, 2011
- SNU Precision Co., Ltd.
- Heui Jae Park
- G01 - MEASURING TESTING
Information Patent Application
DETECTING MATERIALS ON WAFER AND REPAIR SYSTEM AND METHOD THEREOF
- Publication number 20100029019
- Publication date Feb 4, 2010
- SNU PRECISION CO. LTD.
- Heui Jae PARK
- G01 - MEASURING TESTING