Heung-Seon OH

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Cheonan-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Deep learning-based MLCC stacked alignment inspection system and me...
- Patent number 12,210,061
- Issue date Jan 28, 2025
- Korea University of Technology and Education Industry-University Cooperation...
- Heung-Seon Oh
- G01 - MEASURING TESTING
Information Patent Grant
Data classification method and device for hierarchical multi-label...
- Patent number 11,874,856
- Issue date Jan 16, 2024
- Korea University of Technology and Education Industry-University Cooperation...
- Heung-Seon Oh
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DEEP LEARNING-BASED MLCC STACKED ALIGNMENT INSPECTION SYSTEM AND ME...
- Publication number 20240103076
- Publication date Mar 28, 2024
- Korea University of Technology and Education Industry-University Cooperation...
- Heung-Seon OH
- G01 - MEASURING TESTING
Information Patent Application
DATA CLASSIFICATION METHOD AND DEVICE FOR HIERARCHICAL MULTI-LABEL...
- Publication number 20230195756
- Publication date Jun 22, 2023
- KOREA UNIVERSITY OF TECHNOLOGY AND EDUCATION INDUSTRY-UNIVERSITY COOPERATION...
- Heung-Seon OH
- G06 - COMPUTING CALCULATING COUNTING