HIDEAKI HASHIMOTO

Person

Kanagawa-Ken, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Multibeam inspection apparatus
- Patent number 11,189,459
- Issue date Nov 30, 2021
- NuFlare Technology, Inc.
- Hideaki Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 11,004,193
- Issue date May 11, 2021
- NuFlare Technology, Inc.
- Ryoichi Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device, inspection method, and storage medium
- Patent number 10,997,713
- Issue date May 4, 2021
- Kabushiki Kaisha Toshiba
- Takeshi Morino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection method and pattern inspection apparatus
- Patent number 10,984,525
- Issue date Apr 20, 2021
- NuFlare Technology, Inc.
- Ryoichi Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection apparatus and pattern inspection method
- Patent number 10,846,846
- Issue date Nov 24, 2020
- NuFlare Technology, Inc.
- Masataka Shiratsuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam inspection apparatus and electron beam inspection method
- Patent number 10,775,326
- Issue date Sep 15, 2020
- NuFlare Technology, Inc.
- Hideo Tsuchiya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam inspection apparatus and electron beam inspection method
- Patent number 10,712,295
- Issue date Jul 14, 2020
- NUFLARE TECHNOLOGY, INC.
- Hideo Tsuchiya
- G01 - MEASURING TESTING
Information Patent Grant
Line width error obtaining method, line width error obtaining appar...
- Patent number 9,646,374
- Issue date May 9, 2017
- NuFlare Technology, Inc.
- Hideaki Hashimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 9,575,010
- Issue date Feb 21, 2017
- NuFlare Technology, Inc.
- Riki Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection sensitivity evaluation method
- Patent number 9,196,033
- Issue date Nov 24, 2015
- NuFlare Technology, Inc.
- Hideaki Hashimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection method of semiconductor device optical image
- Patent number 9,021,406
- Issue date Apr 28, 2015
- NuFlare Technology, Inc.
- Hideaki Hashimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Robot controller and robot controlling method
- Patent number 7,765,023
- Issue date Jul 27, 2010
- Kabushiki Kaisha Toshiba
- Junji Oaki
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Wheeled moving robot
- Patent number 7,570,005
- Issue date Aug 4, 2009
- Kabushiki Kaisha Toshiba
- Hideaki Hashimoto
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
System for controlling a plurality of equipments
- Patent number 7,522,636
- Issue date Apr 21, 2009
- Kabushiki Kaisha Toshiba
- Hirokazu Sato
- G08 - SIGNALLING
Information Patent Grant
Wheeled moving robot
- Patent number 7,397,214
- Issue date Jul 8, 2008
- Kabushiki Kaisha Toshiba
- Hideaki Hashimoto
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Robot hand and robot
- Patent number 5,373,747
- Issue date Dec 20, 1994
- Kabushiki Kaisha Toshiba
- Hideki Ogawa
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Robot hand including optical approach sensing apparatus
- Patent number 4,766,322
- Issue date Aug 23, 1988
- Kabushiki Kaisha Toshiba
- Hideaki Hashimoto
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS

Patents Applicationslast 30 patents

Information Patent Application
MULTIBEAM INSPECTION APPARATUS
- Publication number 20200395191
- Publication date Dec 17, 2020
- NuFlare Technology, Inc.
- Hideaki HASHIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Inspection Apparatus and Electron Beam Inspection Method
- Publication number 20190369035
- Publication date Dec 5, 2019
- NUFLARE TECHNOLOGY, INC.
- Hideo Tsuchiya
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20190346769
- Publication date Nov 14, 2019
- NuFlare Technology, Inc.
- Hideaki Hashimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRON BEAM INSPECTION APPARATUS AND ELECTRON BEAM INSPECTION METHOD
- Publication number 20190277782
- Publication date Sep 12, 2019
- NuFlare Technology, Inc.
- Hideo Tsuchiya
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE, INSPECTION METHOD, AND STORAGE MEDIUM
- Publication number 20190279349
- Publication date Sep 12, 2019
- KABUSHIKI KAISHA TOSHIBA
- Takeshi MORINO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS
- Publication number 20190279348
- Publication date Sep 12, 2019
- NuFlare Technology, Inc.
- Ryoichi Hirano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20190213726
- Publication date Jul 11, 2019
- NuFlare Technology, Inc.
- Ryoichi Hirano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20190066286
- Publication date Feb 28, 2019
- NuFlare Technology, Inc.
- Masataka SHIRATSUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20160370300
- Publication date Dec 22, 2016
- NuFlare Technology, Inc.
- Riki OGAWA
- G01 - MEASURING TESTING
Information Patent Application
LINE WIDTH ERROR OBTAINING METHOD, LINE WIDTH ERROR OBTAINING APPAR...
- Publication number 20160247267
- Publication date Aug 25, 2016
- NuFlare Technology, Inc.
- Hideaki HASHIMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SENSITIVITY EVALUATION METHOD
- Publication number 20140348414
- Publication date Nov 27, 2014
- NuFlare Technology, Inc.
- Hideaki HASHIMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION METHOD
- Publication number 20140310662
- Publication date Oct 16, 2014
- NuFlare Technology, Inc.
- Hideaki HASHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
WHEELED MOVING ROBOT
- Publication number 20080231222
- Publication date Sep 25, 2008
- Kabushiki Kaisha Toshiba
- HIDEAKI HASHIMOTO
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Transmitting device, receiving device, and optical communication me...
- Publication number 20080219676
- Publication date Sep 11, 2008
- Kabushiki Kaisha Toshiba
- Seiji Tokura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
WHEELED MOVING ROBOT
- Publication number 20070132419
- Publication date Jun 14, 2007
- KABUSHHIKI KAISHA TOSHIBA
- Hideaki Hashimoto
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Robot controller and robot controlling method
- Publication number 20050246061
- Publication date Nov 3, 2005
- Kabushiki Kaisha Toshiba
- Junji Oaki
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Controller system and controller for mechatronics device
- Publication number 20050222696
- Publication date Oct 6, 2005
- Kabushiki Kaisha Toshiba
- Fumio Ozaki
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
System for controlling a plurality of equipments
- Publication number 20050123000
- Publication date Jun 9, 2005
- Kabushiki Kaisha Toshiba
- Hirokazu Sato
- G05 - CONTROLLING REGULATING

HIDEAKI HASHIMOTO

Person

Patents Grantslast 30 patents

Multibeam inspection apparatus

Inspection method and inspection apparatus

Inspection device, inspection method, and storage medium

Pattern inspection method and pattern inspection apparatus

Pattern inspection apparatus and pattern inspection method

Electron beam inspection apparatus and electron beam inspection method

Electron beam inspection apparatus and electron beam inspection method

Line width error obtaining method, line width error obtaining appar...

Inspection apparatus and inspection method

Inspection sensitivity evaluation method

Pattern inspection method of semiconductor device optical image

Robot controller and robot controlling method

Wheeled moving robot

System for controlling a plurality of equipments

Wheeled moving robot

Robot hand and robot

Robot hand including optical approach sensing apparatus

Patents Applicationslast 30 patents

MULTIBEAM INSPECTION APPARATUS

Electron Beam Inspection Apparatus and Electron Beam Inspection Method

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

ELECTRON BEAM INSPECTION APPARATUS AND ELECTRON BEAM INSPECTION METHOD

INSPECTION DEVICE, INSPECTION METHOD, AND STORAGE MEDIUM

PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS

INSPECTION METHOD AND INSPECTION APPARATUS

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

LINE WIDTH ERROR OBTAINING METHOD, LINE WIDTH ERROR OBTAINING APPAR...

INSPECTION SENSITIVITY EVALUATION METHOD

PATTERN INSPECTION METHOD

WHEELED MOVING ROBOT

Transmitting device, receiving device, and optical communication me...

WHEELED MOVING ROBOT

Robot controller and robot controlling method

Controller system and controller for mechatronics device

System for controlling a plurality of equipments