Hideaki IZUMI

Person

Kyoto-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometer
- Patent number 12,027,360
- Issue date Jul 2, 2024
- Shimadzu Corporation
- Hiroyuki Miura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 11,990,328
- Issue date May 21, 2024
- Shimadzu Corporation
- Hiroyuki Miura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 11,587,780
- Issue date Feb 21, 2023
- Shimadzu Corporation
- Yusuke Tateishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for mass spectrometry and mass spectrometer
- Patent number 11,569,080
- Issue date Jan 31, 2023
- Shimadzu Corporation
- Hiroyuki Miura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometric data analysis device and analysis method
- Patent number 11,521,842
- Issue date Dec 6, 2022
- Shimadzu Corporation
- Hideaki Izumi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Time-of-flight mass spectrometer and program
- Patent number 11,361,957
- Issue date Jun 14, 2022
- Shimadzu Corporation
- Hideaki Izumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiturn time-of-flight mass spectrometer and method for producing...
- Patent number 11,094,522
- Issue date Aug 17, 2021
- Shimadzu Corporation
- Hiroyuki Miura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 10,541,125
- Issue date Jan 21, 2020
- Shimadzu Corporation
- Hiroyuki Miura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate electrode and ion mobility spectrometer
- Patent number 10,197,531
- Issue date Feb 5, 2019
- Shimadzu Corporation
- Akiko Imazu
- G01 - MEASURING TESTING
Information Patent Grant
Ion radiation device and surface analyzer using said device
- Patent number 9,892,902
- Issue date Feb 13, 2018
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer for conducting high resolution mas...
- Patent number 9,613,787
- Issue date Apr 4, 2017
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 8,519,327
- Issue date Aug 27, 2013
- Shimadzu Corporation
- Hideaki Izumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap time-of-flight mass spectrometer
- Patent number 8,247,763
- Issue date Aug 21, 2012
- Shimadzu Corporation
- Hideaki Izumi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MASS SPECTROMETER
- Publication number 20220406588
- Publication date Dec 22, 2022
- Shimadzu Corporation
- Hiroyuki MIURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20220189758
- Publication date Jun 16, 2022
- Shimadzu Corporation
- Yusuke TATEISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MASS SPECTROMETRY AND MASS SPECTROMETER
- Publication number 20220059329
- Publication date Feb 24, 2022
- Shimadzu Corporation
- Hiroyuki MIURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTITURN TIME-OF-FLIGHT MASS SPECTROMETER AND METHOD FOR PRODUCIN...
- Publication number 20210111015
- Publication date Apr 15, 2021
- Shimadzu Corporation
- Hiroyuki MIURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER AND PROGRAM
- Publication number 20200051804
- Publication date Feb 13, 2020
- Shimadzu Corporation
- Hideaki IZUMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRIC DATA ANALYSIS APPARATUS AND ANALYSIS METHOD
- Publication number 20190267222
- Publication date Aug 29, 2019
- SHIMADZU CORPORATION
- Hideaki IZUMI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ION ANALYZER
- Publication number 20190189418
- Publication date Jun 20, 2019
- Shimadzu Corporation
- Hiroyuki MIURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE ELECTRODE AND ION MOBILITY SPECTROMETER
- Publication number 20180246061
- Publication date Aug 30, 2018
- SHIMADZU CORPORATION
- Akiko IMAZU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION RADIATION DEVICE AND SURFACE ANALYZER USING SAID DEVICE
- Publication number 20170154764
- Publication date Jun 1, 2017
- Shimadzu Corporation
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20120175514
- Publication date Jul 12, 2012
- SHIMADZU CORPORATION
- Hideaki Izumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Turn Time-of-Flight Mass Spectrometer
- Publication number 20110248161
- Publication date Oct 13, 2011
- SHIMADZU CORPORATION
- Kengo Takeshita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time-Of-Flight Mass Spectrometer
- Publication number 20110192972
- Publication date Aug 11, 2011
- SHIMADZU CORPORATION
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION TRAP TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20090278042
- Publication date Nov 12, 2009
- SHIMADZU CORPORATION
- Hideaki Izumi
- H01 - BASIC ELECTRIC ELEMENTS

Hideaki IZUMI

Person

Patents Grantslast 30 patents

Mass spectrometer

Mass spectrometer

Time-of-flight mass spectrometer

Method for mass spectrometry and mass spectrometer

Mass spectrometric data analysis device and analysis method

Time-of-flight mass spectrometer and program

Multiturn time-of-flight mass spectrometer and method for producing...

Ion analyzer

Gate electrode and ion mobility spectrometer

Ion radiation device and surface analyzer using said device

Time-of-flight mass spectrometer for conducting high resolution mas...

Mass spectrometer

Ion trap time-of-flight mass spectrometer

Patents Applicationslast 30 patents

MASS SPECTROMETER

TIME-OF-FLIGHT MASS SPECTROMETER

METHOD FOR MASS SPECTROMETRY AND MASS SPECTROMETER

MULTITURN TIME-OF-FLIGHT MASS SPECTROMETER AND METHOD FOR PRODUCIN...

TIME-OF-FLIGHT MASS SPECTROMETER AND PROGRAM

MASS SPECTROMETRIC DATA ANALYSIS APPARATUS AND ANALYSIS METHOD

ION ANALYZER

GATE ELECTRODE AND ION MOBILITY SPECTROMETER

ION RADIATION DEVICE AND SURFACE ANALYZER USING SAID DEVICE

Mass Spectrometer

Multi-Turn Time-of-Flight Mass Spectrometer

Time-Of-Flight Mass Spectrometer

ION TRAP TIME-OF-FLIGHT MASS SPECTROMETER