Hideaki KOIKE

Follow

Person

Chino, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical device with propagating and localized surface plasmons and...
- Patent number 9,057,697
- Issue date Jun 16, 2015
- Seiko Epson Corporation
- Jun Amako
- G01 - MEASURING TESTING
Information Patent Grant
Sample analysis element and detecting device
- Patent number 8,836,947
- Issue date Sep 16, 2014
- Seiko Epson Corporation
- Jun Amako
- G01 - MEASURING TESTING
Information Patent Grant
Sample analysis element and detecting device
- Patent number 8,817,263
- Issue date Aug 26, 2014
- Seiko Epson Corporation
- Mamoru Sugimoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE ANALYSIS ELEMENT AND DETECTING DEVICE
- Publication number 20130182258
- Publication date Jul 18, 2013
- SEIKO EPSON CORPORATION
- Jun AMAKO
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS ELEMENT AND DETECTING DEVICE
- Publication number 20130182257
- Publication date Jul 18, 2013
- SEIKO EPSON CORPORATION
- Mamoru SUGIMOTO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE AND DETECTION APPARATUS
- Publication number 20130092823
- Publication date Apr 18, 2013
- SEIKO EPSON CORPORATION
- Jun AMAKO
- G02 - OPTICS
Information Patent Application
LIGHT SOURCE DEVICE AND PROJECTION DISPLAY DEVICE
- Publication number 20110085147
- Publication date Apr 14, 2011
- SEIKO EPSON CORPORATION
- Junichi SUZUKI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY