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Hideaki MURASE

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  • Yokohama Kanagawa, JP
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Patents Applicationslast 30 patents

  • Information Patent Application

    SENSOR, SENSOR SYSTEM, AND ELECTRONIC DEVICE
    • Publication number 20250076047
    • Publication date Mar 6, 2025
    • Kabushiki Kaisha Toshiba
    • Daiki ONO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR, SENSOR SYSTEM, AND ELECTRONIC DEVICE
    • Publication number 20250076049
    • Publication date Mar 6, 2025
    • Kabushiki Kaisha Toshiba
    • Fumito MIYAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR, SENSOR SYSTEM, AND ELECTRONIC DEVICE
    • Publication number 20250076054
    • Publication date Mar 6, 2025
    • Kabushiki Kaisha Toshiba
    • Fumito MIYAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR, SENSOR SYSTEM, AND ELECTRONIC DEVICE
    • Publication number 20250076089
    • Publication date Mar 6, 2025
    • Kabushiki Kaisha Toshiba
    • Yasushi TOMIZAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR, SENSOR SYSTEM, AND ELECTRONIC DEVICE
    • Publication number 20250076046
    • Publication date Mar 6, 2025
    • Kabushiki Kaisha Toshiba
    • Hideaki MURASE
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR, SENSOR SYSTEM, AND ELECTRONIC DEVICE
    • Publication number 20250076050
    • Publication date Mar 6, 2025
    • Kabushiki Kaisha Toshiba
    • Hideaki MURASE
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240401949
    • Publication date Dec 5, 2024
    • Kabushiki Kaisha Toshiba
    • Hideaki MURASE
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240310404
    • Publication date Sep 19, 2024
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR
    • Publication number 20240288270
    • Publication date Aug 29, 2024
    • Kabushiki Kaisha Toshiba
    • Fumito MIYAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240085181
    • Publication date Mar 14, 2024
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240085451
    • Publication date Mar 14, 2024
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • G01 - MEASURING TESTING