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Hideaki Nakane
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Hachioji-shi, Tokyo, JP
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last 30 patents
Information
Patent Grant
Superconducting device
Patent number
5,550,389
Issue date
Aug 27, 1996
Hitachi, Ltd.
Toshikazu Nishino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Oxide superconducting device
Patent number
5,256,897
Issue date
Oct 26, 1993
Hitachi, Ltd.
Haruhiro Hasegawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Noise canceling high-sensitive magnetometer
Patent number
5,252,921
Issue date
Oct 12, 1993
Research Development Corporation of Japan
Hideaki Nakane
G01 - MEASURING TESTING
Information
Patent Grant
Superconductive quantum interference device in high temperature env...
Patent number
5,218,297
Issue date
Jun 8, 1993
Hitachi, Ltd.
Hideaki Nakane
G01 - MEASURING TESTING
Information
Patent Grant
Integrated-type SQUID magnetometer having a magnetic shield, and a...
Patent number
5,166,614
Issue date
Nov 24, 1992
Hitachi, Ltd.
Koichi Yokosawa
G01 - MEASURING TESTING
Information
Patent Grant
Magnetometer using a Josephson device and superconducting phototran...
Patent number
4,906,930
Issue date
Mar 6, 1990
Hitachi, Ltd.
Hideaki Nakane
G01 - MEASURING TESTING
Information
Patent Grant
Circuit for detecting AC magnetic field due to magnetic resonance w...
Patent number
4,875,010
Issue date
Oct 17, 1989
Hitachi, Ltd.
Koichi Yokosawa
G01 - MEASURING TESTING
Information
Patent Grant
Superconducting current detecting circuit employing DC flux paramet...
Patent number
4,866,373
Issue date
Sep 12, 1989
Hitachi, Ltd.
Yutaka Harada
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus based on nuclear magnetic resonance
Patent number
4,777,443
Issue date
Oct 11, 1988
Hitachi, Ltd.
Masao Yabusaki
G01 - MEASURING TESTING