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Hideaki Nii
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Cambridge, MA, US
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last 30 patents
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Patent Grant
System and method for sensing geometric and photometric attributes...
Patent number
8,009,192
Issue date
Aug 30, 2011
Mitsubishi Electric Research Laboratories, Inc.
Ramesh Raskar
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
System and method for measuring scene reflectance using optical sen...
Publication number
20070268481
Publication date
Nov 22, 2007
Ramesh Raskar
G06 - COMPUTING CALCULATING COUNTING
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Patent Application
System and method for sensing geometric and photometric attributes...
Publication number
20070268363
Publication date
Nov 22, 2007
Ramesh Raskar
G06 - COMPUTING CALCULATING COUNTING