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Hideaki Nishida
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Chino, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Sample analysis element and detection device
Patent number
9,228,944
Issue date
Jan 5, 2016
Seiko Epson Corporation
Mamoru Sugimoto
G01 - MEASURING TESTING
Information
Patent Grant
Sample analysis device, testing apparatus, and sensor cartridge
Patent number
9,222,889
Issue date
Dec 29, 2015
Seiko Epson Corporation
Mamoru Sugimoto
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
ROTARY MOTOR AND ROBOT ARM
Publication number
20220352799
Publication date
Nov 3, 2022
SEIKO EPSON CORPORATION
Hideaki NISHIDA
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
ROTARY MOTOR AND ROBOT
Publication number
20220239207
Publication date
Jul 28, 2022
SEIKO EPSON CORPORATION
Hideaki NISHIDA
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
ROTARY MOTOR AND ROBOT
Publication number
20220166265
Publication date
May 26, 2022
SEIKO EPSON CORPORATION
Shigekazu TAKAGI
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Application
ROTARY MOTOR AND MANUFACTURING METHOD FOR ROTOR
Publication number
20220149683
Publication date
May 12, 2022
SEIKO EPSON CORPORATION
Hiroshi KOEDA
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
SAMPLE ANALYSIS DEVICE, TESTING APPARATUS, AND SENSOR CARTRIDGE
Publication number
20150138543
Publication date
May 21, 2015
SEIKO EPSON CORPORATION
Mamoru Sugimoto
B82 - NANO-TECHNOLOGY
Information
Patent Application
DETECTION APPARATUS
Publication number
20150124258
Publication date
May 7, 2015
SEIKO EPSON CORPORATION
Jun Amako
B82 - NANO-TECHNOLOGY
Information
Patent Application
SAMPLE ANALYSIS ELEMENT AND DETECTION DEVICE
Publication number
20150109619
Publication date
Apr 23, 2015
SEIKO EPSON CORPORATION
Mamoru Sugimoto
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYSIS ELEMENT AND DETECTION DEVICE
Publication number
20150103347
Publication date
Apr 16, 2015
SEIKO EPSON CORPORATION
Mamoru Sugimoto
G01 - MEASURING TESTING