Hideaki Nishizawa

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Nishinomiya, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of measuring junction temperature
- Patent number 5,401,099
- Issue date Mar 28, 1995
- Sumitomo Electric Industries, Ltd.
- Hideaki Nishizawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a distributed brass reflector type semicond...
- Patent number 5,045,499
- Issue date Sep 3, 1991
- Research Development Corporation of Japan
- Hideaki Nishizawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Distributed bragg reflector type semiconductor laser
- Patent number 4,914,670
- Issue date Apr 3, 1990
- Nishizawa; Hideaki
- Hideaki Nishizawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing an optical device
- Patent number 4,727,649
- Issue date Mar 1, 1988
- Sumitomo Electric Industries, Ltd.
- Hideaki Nishizawa
- G02 - OPTICS
Information Patent Grant
Package for optical device
- Patent number 4,663,652
- Issue date May 5, 1987
- Sumotomo Electric Industries, Ltd.
- Hideaki Nishizawa
- G02 - OPTICS
Information Patent Grant
Package for optical element
- Patent number 4,636,647
- Issue date Jan 13, 1987
- Sumitomo Electric Industries, Ltd.
- Hideaki Nishizawa
- G02 - OPTICS
Information Patent Grant
Multi-photodiodes
- Patent number 4,297,720
- Issue date Oct 27, 1981
- Sumitomo Electric Industries, Ltd.
- Hideaki Nishizawa
- H01 - BASIC ELECTRIC ELEMENTS