Hideaki Onozuka

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Tokyo, JP

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Patents Applicationslast 30 patents

Information Patent Application
Processing Abnormality Detection Method and Processing Device
- Publication number 20140288882
- Publication date Sep 25, 2014
- Hitachi, Ltd
- Nobuaki Nakasu
- G01 - MEASURING TESTING
Information Patent Application
Working Abnormality Detecting Device and Working Abnormality Detect...
- Publication number 20140123740
- Publication date May 8, 2014
- Hitachi, Ltd
- Takehisa Yoshikawa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR