Hideaki Sasazawa

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray inspection method and device
- Patent number 10,352,879
- Issue date Jul 16, 2019
- Hitachi High-Technologies Corporaiton
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection device of substrate surface and pattern inspecti...
- Patent number 8,736,830
- Issue date May 27, 2014
- Hitachi, Ltd.
- Masahiro Watanabe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for defect determination in fine concave-convex pattern and...
- Patent number 8,638,430
- Issue date Jan 28, 2014
- Hitachi High-Technologies Corporation
- Hideaki Sasazawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a surface of a substrate
- Patent number 8,547,545
- Issue date Oct 1, 2013
- Hitachi High-Technologies Corporation
- Hideaki Sasazawa
- G01 - MEASURING TESTING
Information Patent Grant
Scatterometry method and device for inspecting patterned medium
- Patent number 8,411,928
- Issue date Apr 2, 2013
- Hitachi High-Technologies Corporation
- Hideaki Sasazawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic device inspection apparatus and magnetic device inspection...
- Patent number 8,359,661
- Issue date Jan 22, 2013
- Hitachi High-Technologies Corporation
- Takehiro Tachizaki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Spectral detection method and device, and defect inspection method...
- Patent number 8,279,431
- Issue date Oct 2, 2012
- Hitachi, Ltd.
- Takenori Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Pattern shape inspection method and apparatus thereof
- Patent number 8,260,029
- Issue date Sep 4, 2012
- Hitachi High-Technologies Corporation
- Keiya Saito
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Disk surface inspection apparatus, inspection system thereof, and i...
- Patent number 8,253,935
- Issue date Aug 28, 2012
- Hitachi High-Technologies Corporation
- Tatsuo Hariyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a pattern shape
- Patent number 8,040,772
- Issue date Oct 18, 2011
- Hitachi High-Technologies Corporation
- Keiya Saito
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and device for detecting shape of surface of medium
- Patent number 7,969,567
- Issue date Jun 28, 2011
- Hitachi High-Technologies Corporation
- Minoru Yoshida
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for detecting defects on a disk surface
- Patent number 7,898,652
- Issue date Mar 1, 2011
- Hitachi High-Technologies Corporation
- Tatsuo Hariyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for semiconductor device production process mo...
- Patent number 7,816,062
- Issue date Oct 19, 2010
- Hitachi High-Technologies Corporation
- Wataru Nagatomo
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Dimension measuring SEM system, method of evaluating shape of circu...
- Patent number 7,449,689
- Issue date Nov 11, 2008
- Hitachi High-Technologies Corporation
- Wataru Nagatomo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit board production method and its apparatus
- Patent number 7,355,143
- Issue date Apr 8, 2008
- Hitachi, Ltd.
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring shape of bumps
- Patent number 7,336,816
- Issue date Feb 26, 2008
- Hitachi Via Mechanics, Ltd.
- Hideaki Sasazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for controlling semiconductor device production process and...
- Patent number 7,273,685
- Issue date Sep 25, 2007
- Renesas Technology Corp.
- Hideaki Sasazawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical recording apparatus capable of changing the length of synch...
- Patent number 7,092,348
- Issue date Aug 15, 2006
- Hitachi, Ltd.
- Hideaki Sasazawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and its apparatus for measuring size and shape of fine patterns
- Patent number 7,084,990
- Issue date Aug 1, 2006
- Hitachi, Ltd.
- Hideaki Sasazawa
- G01 - MEASURING TESTING
Information Patent Grant
Optical recording apparatus capable of changing the length of synch...
- Patent number 7,075,884
- Issue date Jul 11, 2006
- Hitachi, Ltd.
- Hideaki Sasazawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for measuring dimensions and alignment of thin film magnetic...
- Patent number 6,831,277
- Issue date Dec 14, 2004
- Hitachi, Ltd.
- Toshihiko Nakata
- G11 - INFORMATION STORAGE
Information Patent Grant
Manufacturing method for thin film magnetic heads
- Patent number 6,631,547
- Issue date Oct 14, 2003
- Hitachi, Ltd.
- Minoru Yoshida
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for automatic focusing and a method and appara...
- Patent number 5,780,866
- Issue date Jul 14, 1998
- Hitachi, Ltd.
- Hisae Yamamura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Defect Determining Method and X-Ray Inspection Device
- Publication number 20180209924
- Publication date Jul 26, 2018
- Hitachi High-Technologies Corporation
- Hideaki SASAZAWA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION METHOD AND DEVICE
- Publication number 20170261441
- Publication date Sep 14, 2017
- Hitachi High-Technologies Corporation
- Toshiyuki Nakao
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE SURFACE DEFECT INSPECTION METHOD AND INSPECTION DEVICE
- Publication number 20130077092
- Publication date Mar 28, 2013
- Hitachi High-Technologies Corporation
- Hideaki SASAZAWA
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION METHOD AND DEVICE FOR SAME
- Publication number 20120287426
- Publication date Nov 15, 2012
- Hideaki Sasazawa
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING A SURFACE OF A SUBSTRATE
- Publication number 20120081701
- Publication date Apr 5, 2012
- Hitachi High-Technologies Corporation
- Hideaki SASAZAWA
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION DEVICE OF SUBSTRATE SURFACE AND PATTERN INSPECTI...
- Publication number 20120013890
- Publication date Jan 19, 2012
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DEFECT DETERMINATION IN FINE CONCAVE-CONVEX PATTERN AND...
- Publication number 20110001962
- Publication date Jan 6, 2011
- Hitachi High-Technologies Corporation
- Hideaki Sasazawa
- G01 - MEASURING TESTING
Information Patent Application
DISK SURFACE INSPECTION APPARATUS, INSPECTION SYSTEM THEREOF, AND I...
- Publication number 20100201975
- Publication date Aug 12, 2010
- Tatsuo HARIYAMA
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC DEVICE INSPECTION APPARATUS AND MAGNETIC DEVICE INSPECTION...
- Publication number 20100205699
- Publication date Aug 12, 2010
- Takehiro TACHIZAKI
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL DETECTION METHOD AND DEVICE, AND DEFECT INSPECTION METHOD...
- Publication number 20100182589
- Publication date Jul 22, 2010
- Hitachi, Ltd.
- Takenori HIROSE
- G01 - MEASURING TESTING
Information Patent Application
PATTERN SHAPE INSPECTION METHOD AND APPARATUS THEREOF
- Publication number 20100124370
- Publication date May 20, 2010
- Keiya SAITO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR INSPECTING PATTERNED MEDIUM
- Publication number 20100098320
- Publication date Apr 22, 2010
- Hitachi High-Technologies Corporation
- Hideaki SASAZAWA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETECTING SHAPE OF SURFACE OF MEDIUM
- Publication number 20100085855
- Publication date Apr 8, 2010
- Hitachi High-Technologies Corporation
- Minoru YOSHIDA
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING A PATTERN SHAPE
- Publication number 20090262621
- Publication date Oct 22, 2009
- Keiya SAITO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTS ON A DISK SURFACE
- Publication number 20090190123
- Publication date Jul 30, 2009
- Tatsuo HARIYAMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING PLASMA DISPLAY PANEL, AND APPARATUS FOR IN...
- Publication number 20080145517
- Publication date Jun 19, 2008
- Hideaki SASAZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for semiconductor device production process mo...
- Publication number 20070105243
- Publication date May 10, 2007
- Wataru Nagatomo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for controlling semiconductor device production process and...
- Publication number 20060183040
- Publication date Aug 17, 2006
- Hideaki Sasazawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Dimension measuring SEM system, method of evaluating shape of circu...
- Publication number 20060108524
- Publication date May 25, 2006
- Wataru Nagatomo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Information recording method and apparatus
- Publication number 20050243683
- Publication date Nov 3, 2005
- Hideaki Sasazawa
- G11 - INFORMATION STORAGE
Information Patent Application
Information recording method and apparatus
- Publication number 20050243684
- Publication date Nov 3, 2005
- Hideaki Sasazawa
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for measuring shape of bumps
- Publication number 20050129304
- Publication date Jun 16, 2005
- Hideaki Sasazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and its apparatus for measuring size and shape of fine patterns
- Publication number 20030223087
- Publication date Dec 4, 2003
- Hideaki Sasazawa
- G01 - MEASURING TESTING
Information Patent Application
Manufacturing method for thin film magnetic heads, inspecting metho...
- Publication number 20020029459
- Publication date Mar 14, 2002
- Minoru Yoshida
- B82 - NANO-TECHNOLOGY

Hideaki Sasazawa

Person

Patents Grantslast 30 patents

X-ray inspection method and device

Pattern inspection device of substrate surface and pattern inspecti...

Method for defect determination in fine concave-convex pattern and...

Method and apparatus for inspecting a surface of a substrate

Scatterometry method and device for inspecting patterned medium

Magnetic device inspection apparatus and magnetic device inspection...

Spectral detection method and device, and defect inspection method...

Pattern shape inspection method and apparatus thereof

Disk surface inspection apparatus, inspection system thereof, and i...

Method and apparatus for inspecting a pattern shape

Method and device for detecting shape of surface of medium

Method and apparatus for detecting defects on a disk surface

Method and apparatus for semiconductor device production process mo...

Dimension measuring SEM system, method of evaluating shape of circu...

Circuit board production method and its apparatus

Method and apparatus for measuring shape of bumps

Method for controlling semiconductor device production process and...

Optical recording apparatus capable of changing the length of synch...

Method and its apparatus for measuring size and shape of fine patterns

Optical recording apparatus capable of changing the length of synch...

Method for measuring dimensions and alignment of thin film magnetic...

Manufacturing method for thin film magnetic heads

Method and apparatus for automatic focusing and a method and appara...

Patents Applicationslast 30 patents

Defect Determining Method and X-Ray Inspection Device

X-RAY INSPECTION METHOD AND DEVICE

SUBSTRATE SURFACE DEFECT INSPECTION METHOD AND INSPECTION DEVICE

PATTERN INSPECTION METHOD AND DEVICE FOR SAME

METHOD AND APPARATUS FOR INSPECTING A SURFACE OF A SUBSTRATE

PATTERN INSPECTION DEVICE OF SUBSTRATE SURFACE AND PATTERN INSPECTI...

METHOD FOR DEFECT DETERMINATION IN FINE CONCAVE-CONVEX PATTERN AND...

DISK SURFACE INSPECTION APPARATUS, INSPECTION SYSTEM THEREOF, AND I...

MAGNETIC DEVICE INSPECTION APPARATUS AND MAGNETIC DEVICE INSPECTION...

SPECTRAL DETECTION METHOD AND DEVICE, AND DEFECT INSPECTION METHOD...

PATTERN SHAPE INSPECTION METHOD AND APPARATUS THEREOF

METHOD AND DEVICE FOR INSPECTING PATTERNED MEDIUM

METHOD AND DEVICE FOR DETECTING SHAPE OF SURFACE OF MEDIUM

METHOD AND APPARATUS FOR INSPECTING A PATTERN SHAPE

METHOD AND APPARATUS FOR DETECTING DEFECTS ON A DISK SURFACE

METHOD FOR MANUFACTURING PLASMA DISPLAY PANEL, AND APPARATUS FOR IN...

Method and apparatus for semiconductor device production process mo...

Method for controlling semiconductor device production process and...

Dimension measuring SEM system, method of evaluating shape of circu...

Information recording method and apparatus

Information recording method and apparatus

Method and apparatus for measuring shape of bumps

Method and its apparatus for measuring size and shape of fine patterns

Manufacturing method for thin film magnetic heads, inspecting metho...