Hidefumi Ibe

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Simulation apparatus and simulation method for determining soft err...
- Patent number 9,507,895
- Issue date Nov 29, 2016
- Hitachi, Ltd.
- Tadanobu Toba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic apparatus
- Patent number 8,904,233
- Issue date Dec 2, 2014
- Hitachi, Ltd.
- Hidefumi Ibe
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device and measurement method
- Patent number 8,892,967
- Issue date Nov 18, 2014
- Hitachi, Ltd.
- Hidefumi Ibe
- G11 - INFORMATION STORAGE
Information Patent Grant
Analyzer/observer
- Patent number 6,762,422
- Issue date Jul 13, 2004
- Hitachi, Ltd.
- Hironaru Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nuclear power plant having a water chemistry control system for a p...
- Patent number 5,398,268
- Issue date Mar 14, 1995
- Hitachi, Ltd.
- Hidefumi Ibe
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Plant diagnosis apparatus and method
- Patent number 5,369,674
- Issue date Nov 29, 1994
- Hitachi, Ltd.
- Kenji Yokose
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Sensor for controlling water quality of reactor and method of contr...
- Patent number 5,201,229
- Issue date Apr 13, 1993
- Hitachi, Ltd.
- Hidefumi Ibe
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring dissolved gas concentrations
- Patent number 4,578,154
- Issue date Mar 25, 1986
- Hitachi, Ltd.
- Masao Kitamura
- G01 - MEASURING TESTING
Information Patent Grant
Sodium ionization detector
- Patent number 4,366,438
- Issue date Dec 28, 1982
- Hitachi, Ltd.
- Hidefumi Ibe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SIMULATION APPARATUS AND SIMULATION METHOD
- Publication number 20130132056
- Publication date May 23, 2013
- Tadanobu Toba
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC APPARATUS
- Publication number 20120304005
- Publication date Nov 29, 2012
- Hidefumi Ibe
- G01 - MEASURING TESTING
Information Patent Application
Measurement Device and Measurement Method
- Publication number 20120159269
- Publication date Jun 21, 2012
- Hitachi, Ltd
- Hidefumi IBE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Analyzer/observer
- Publication number 20030116720
- Publication date Jun 26, 2003
- Hironaru Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS

Hidefumi Ibe

Person

Patents Grantslast 30 patents

Simulation apparatus and simulation method for determining soft err...

Electronic apparatus

Measurement device and measurement method

Analyzer/observer

Nuclear power plant having a water chemistry control system for a p...

Plant diagnosis apparatus and method

Sensor for controlling water quality of reactor and method of contr...

Method and apparatus for measuring dissolved gas concentrations

Sodium ionization detector

Patents Applicationslast 30 patents

SIMULATION APPARATUS AND SIMULATION METHOD

ELECTRONIC APPARATUS

Measurement Device and Measurement Method

Analyzer/observer