Hidehiko SUETSUGU

Person

Niihama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect measurement device, defect measurement method, and inspectio...
- Patent number 11,821,870
- Issue date Nov 21, 2023
- Sumitomo Chemical Company, Limited
- Toyokazu Tada
- G01 - MEASURING TESTING
Information Patent Grant
Defect measurement method, defect measurement device, and testing p...
- Patent number 10,539,535
- Issue date Jan 21, 2020
- Sumitomo Chemical Company, Limited
- Toyokazu Tada
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current flaw detection probe and eddy current flaw inspection...
- Patent number 9,453,818
- Issue date Sep 27, 2016
- Sumitomo Chemical Company, Limited
- Hidehiko Suetsugu
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current flaw detection probe
- Patent number 8,928,315
- Issue date Jan 6, 2015
- Sumitomo Chemical Company, Limited
- Mitsuo Hashimoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEFECT MEASUREMENT METHOD, DEFECT MEASUREMENT DEVICE, AND TESTING P...
- Publication number 20220003713
- Publication date Jan 6, 2022
- Sumitomo Chemical Company, Limited
- Toyokazu Tada
- G01 - MEASURING TESTING
Information Patent Application
DEFECT MEASUREMENT DEVICE, DEFECT MEASUREMENT METHOD, AND INSPECTIO...
- Publication number 20200319141
- Publication date Oct 8, 2020
- Sumitomo Chemical Company, Limited
- Toyokazu Tada
- G01 - MEASURING TESTING
Information Patent Application
DEFECT MEASUREMENT METHOD, DEFECT MEASUREMENT DEVICE, AND TESTING P...
- Publication number 20180217097
- Publication date Aug 2, 2018
- Sumitomo Chemical Company, Limited
- Toyokazu Tada
- G01 - MEASURING TESTING
Information Patent Application
DEFECT MEASUREMENT METHOD, DEFECT MEASUREMENT DEVICE, AND TESTING P...
- Publication number 20180202975
- Publication date Jul 19, 2018
- Sumitomo Chemical Company, Limited
- Toyokazu Tada
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT FLAW DETECTION PROBE AND EDDY CURRENT FLAW INSPECTION...
- Publication number 20150323502
- Publication date Nov 12, 2015
- Sumitomo Chemical Company, Limited
- Hidehiko SUETSUGU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING CORROSION UNDER INSULATION
- Publication number 20120265450
- Publication date Oct 18, 2012
- Sumitomo Chemical Company, Limited
- Hidehiko Suetsugu
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING AN AUSTENITIC STAINLESS STEEL WELD
- Publication number 20120153944
- Publication date Jun 21, 2012
- Sumitomo Chemical Company, Limited
- Toyokazu Tada
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT FLAW DETECTION PROBE
- Publication number 20120007596
- Publication date Jan 12, 2012
- Mitsuo Hashimoto
- G01 - MEASURING TESTING

Hidehiko SUETSUGU

Person

Patents Grantslast 30 patents

Defect measurement device, defect measurement method, and inspectio...

Defect measurement method, defect measurement device, and testing p...

Eddy current flaw detection probe and eddy current flaw inspection...

Eddy current flaw detection probe

Patents Applicationslast 30 patents

DEFECT MEASUREMENT METHOD, DEFECT MEASUREMENT DEVICE, AND TESTING P...

DEFECT MEASUREMENT DEVICE, DEFECT MEASUREMENT METHOD, AND INSPECTIO...

DEFECT MEASUREMENT METHOD, DEFECT MEASUREMENT DEVICE, AND TESTING P...

DEFECT MEASUREMENT METHOD, DEFECT MEASUREMENT DEVICE, AND TESTING P...

EDDY CURRENT FLAW DETECTION PROBE AND EDDY CURRENT FLAW INSPECTION...

METHOD FOR INSPECTING CORROSION UNDER INSULATION

METHOD FOR INSPECTING AN AUSTENITIC STAINLESS STEEL WELD

EDDY CURRENT FLAW DETECTION PROBE