Hidehiko YASUNO

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Gunma, JP

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Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS AND CIRCUIT SUBSTRATE UNIT
- Publication number 20150276858
- Publication date Oct 1, 2015
- Advantest Corporation
- Hidehiko YASUNO
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND CONNECTION DEVICE
- Publication number 20110248737
- Publication date Oct 13, 2011
- Advantest Corporation
- Satoshi TAKESHITA
- G01 - MEASURING TESTING