Hidehiro KIYOFUJI

Person

Aomori, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Probe card
- Patent number 10,705,122
- Issue date Jul 7, 2020
- Kabushiki Kaisha Nihon Micronics
- Yoshiyuki Fukami
- G01 - MEASURING TESTING
Information Patent Grant
Probe card with temperature control function, inspection apparatus...
- Patent number 10,295,590
- Issue date May 21, 2019
- Kabushiki Kaisha Nihon Micronics
- Yuki Saito
- G01 - MEASURING TESTING
Information Patent Grant
Electric connecting apparatus
- Patent number 9,535,090
- Issue date Jan 3, 2017
- Kabushiki Kaisha Nihon Micronics
- Tatsuo Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Electric connecting apparatus
- Patent number 9,400,309
- Issue date Jul 26, 2016
- Kabushiki Kaisha Nihon Micronics
- Hidehiro Kiyofuji
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and method for manufacturing the same
- Patent number 9,341,651
- Issue date May 17, 2016
- Kabushiki Kaisha Nihon Micronics
- Osamu Arai
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing integrated circuit
- Patent number 8,680,880
- Issue date Mar 25, 2014
- Kabushiki Kaisha Nihon Micronics
- Hidehiro Kiyofuji
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting apparatus
- Patent number 7,843,204
- Issue date Nov 30, 2010
- Kabushiki Kaisha Nihon Micronics
- Hidehiro Kiyofuji
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly, method of producing it and electrical connecting ap...
- Patent number 7,667,472
- Issue date Feb 23, 2010
- Kabushiki Kaisha Nihon Micronics
- Kiyotoshi Miura
- G01 - MEASURING TESTING
Information Patent Grant
Probe board mounting apparatus
- Patent number 7,586,316
- Issue date Sep 8, 2009
- Kabushiki Kaisha Nihon Micronics
- Shinji Kuniyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting apparatus
- Patent number 7,525,329
- Issue date Apr 28, 2009
- Kabushiki Kaisha Nihon Micronics
- Yuji Miyagi
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting apparatus
- Patent number 7,468,610
- Issue date Dec 23, 2008
- Kabushiki Kaisha Nihon Micronics
- Yuji Miyagi
- G01 - MEASURING TESTING
Information Patent Grant
Electric connector and electrical connecting apparatus using the same
- Patent number 7,458,818
- Issue date Dec 2, 2008
- Kabushiki Kaisha Nihon Micronics
- Hidehiro Kiyofuji
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD
- Publication number 20190154730
- Publication date May 23, 2019
- Kabushiki Kaisha Nihon Micronics
- Yoshiyuki FUKAMI
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD WITH TEMPERATURE CONTROL FUNCTION, INSPECTION DEVICE USI...
- Publication number 20170363680
- Publication date Dec 21, 2017
- Kabushiki Kaisha Nihon Micronics
- Yuki SAITO
- G01 - MEASURING TESTING
Information Patent Application
ELECTRIC CONNECTING APPARATUS
- Publication number 20150008945
- Publication date Jan 8, 2015
- Kabushiki Kaisha Nihon Micronics
- Hidehiro KIYOFUJI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRIC CONNECTING APPARATUS
- Publication number 20150008946
- Publication date Jan 8, 2015
- Kabushiki Kaisha Nihon Micronics
- Tatsuo INOUE
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20140368229
- Publication date Dec 18, 2014
- Kabushiki Kaisha Nihon Micronics
- Osamu ARAI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING INTEGRATED CIRCUIT
- Publication number 20100164520
- Publication date Jul 1, 2010
- Kabushiki Kaisha Nihon Micronics
- Hidehiro KIYOFUJI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING APPARATUS
- Publication number 20090212800
- Publication date Aug 27, 2009
- Kabushiki Kaisha Nihon Micronics
- Hidehiro KIYOFUJI
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY, METHOD OF PRODUCING IT AND ELECTRICAL CONNECTING AP...
- Publication number 20090058440
- Publication date Mar 5, 2009
- Kabushiki Kaisha Nihon Micronics
- Kiyotoshi Miura
- G01 - MEASURING TESTING
Information Patent Application
Electrical Connecting Apparatus
- Publication number 20080315905
- Publication date Dec 25, 2008
- Kabushiki Kaisha Nihon Mocronics
- Shinji Kuniyoshi
- G01 - MEASURING TESTING
Information Patent Application
ELECTRIC CONNECTOR AND ELECTRICAL CONNECTING APPARATUS USING THE SAME
- Publication number 20080139017
- Publication date Jun 12, 2008
- Kabushiki Kaisha Nihon Micronics
- Hidehiro KIYOFUJI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING APPARATUS
- Publication number 20080122466
- Publication date May 29, 2008
- Kabushiki Kaisha Nihon Micronics
- Yuji MIYAGI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING APPARATUS
- Publication number 20080122467
- Publication date May 29, 2008
- Kabushiki Kaisha Nihon Micronics
- Yuji MIYAGI
- G01 - MEASURING TESTING
Information Patent Application
Probe assembly
- Publication number 20070069748
- Publication date Mar 29, 2007
- Hidehiro Kiyofuji
- G01 - MEASURING TESTING

Hidehiro KIYOFUJI

Person

Patents Grantslast 30 patents

Probe card

Probe card with temperature control function, inspection apparatus...

Electric connecting apparatus

Electric connecting apparatus

Probe card and method for manufacturing the same

Method and apparatus for testing integrated circuit

Electrical connecting apparatus

Probe assembly, method of producing it and electrical connecting ap...

Probe board mounting apparatus

Electrical connecting apparatus

Electrical connecting apparatus

Electric connector and electrical connecting apparatus using the same

Patents Applicationslast 30 patents

PROBE CARD

PROBE CARD WITH TEMPERATURE CONTROL FUNCTION, INSPECTION DEVICE USI...

ELECTRIC CONNECTING APPARATUS

ELECTRIC CONNECTING APPARATUS

PROBE CARD AND METHOD FOR MANUFACTURING THE SAME

METHOD AND APPARATUS FOR TESTING INTEGRATED CIRCUIT

ELECTRICAL CONNECTING APPARATUS

PROBE ASSEMBLY, METHOD OF PRODUCING IT AND ELECTRICAL CONNECTING AP...

Electrical Connecting Apparatus

ELECTRIC CONNECTOR AND ELECTRICAL CONNECTING APPARATUS USING THE SAME

ELECTRICAL CONNECTING APPARATUS

ELECTRICAL CONNECTING APPARATUS

Probe assembly