Hidehito Obayashi

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Burlingame, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
X-ray exposure system
- Patent number 4,788,698
- Issue date Nov 29, 1988
- Hitachi, Ltd.
- Takeshi Kimura
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electron beam pattern line width measurement system
- Patent number 4,740,693
- Issue date Apr 26, 1988
- Hitachi, Ltd.
- Yoshinori Nakayama
- G01 - MEASURING TESTING