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Hidekazu Maezawa
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Suwa-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Wearable electronic apparatus, data analyzer, and travel record con...
Patent number
9,372,096
Issue date
Jun 21, 2016
Seiko Epson Corporation
Hidekazu Maezawa
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Halt continuation determination method and halt continuation determ...
Patent number
9,332,524
Issue date
May 3, 2016
Seiko Epson Corporation
Shigeru Imafuku
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Execution method of position calculating circuit, position calculat...
Patent number
8,629,804
Issue date
Jan 14, 2014
Seiko Epson Corporation
Toshikazu Akiyama
G01 - MEASURING TESTING
Information
Patent Grant
Initial position determination method, positioning method, and posi...
Patent number
8,373,592
Issue date
Feb 12, 2013
Seiko Epson Corporation
Hidekazu Maezawa
G01 - MEASURING TESTING
Information
Patent Grant
Method of acquiring error correction value of reference frequency,...
Patent number
7,741,995
Issue date
Jun 22, 2010
Seiko Epson Corporation
Hidekazu Maezawa
G01 - MEASURING TESTING
Information
Patent Grant
Portable information processing apparatus
Patent number
6,501,429
Issue date
Dec 31, 2002
Seiko Epson Corporation
Akiyoshi Nakamura
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
PORTABLE ELECTRONIC APPARATUS, CONTROL METHOD, AND PROGRAM
Publication number
20190018445
Publication date
Jan 17, 2019
SEIKO EPSON CORPORATION
Ken WATANABE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SPEED ESTIMATION METHOD, SPEED ESTIMATION DEVICE, AND PORTABLE APPA...
Publication number
20150127285
Publication date
May 7, 2015
SEIKO EPSON CORPORATION
Tsubasa SHIRAI
G01 - MEASURING TESTING
Information
Patent Application
EXECUTION METHOD OF POSITION CALCULATING CIRCUIT, POSITION CALCULAT...
Publication number
20140097983
Publication date
Apr 10, 2014
SEIKO EPSON CORPORATION
Toshikazu Akiyama
G01 - MEASURING TESTING
Information
Patent Application
HALT CONTINUATION DETERMINATION METHOD AND HALT CONTINUATION DETERM...
Publication number
20140045519
Publication date
Feb 13, 2014
SEIKO EPSON CORPORATION
Shigeru IMAFUKU
G01 - MEASURING TESTING
Information
Patent Application
WEARABLE ELECTRONIC APPARATUS, DATA ANALYZER, AND TRAVEL RECORD CON...
Publication number
20140046588
Publication date
Feb 13, 2014
SEIKO EPSON CORPORATION
Hidekazu Maezawa
G01 - MEASURING TESTING
Information
Patent Application
EXECUTION METHOD OF POSITION CALCULATING CIRCUIT, POSITION CALCULAT...
Publication number
20110084875
Publication date
Apr 14, 2011
SEIKO EPSON CORPORATION
Toshikazu Akiyama
G01 - MEASURING TESTING
Information
Patent Application
INITIAL POSITION DETERMINATION METHOD, POSITIONING METHOD, AND POSI...
Publication number
20100176988
Publication date
Jul 15, 2010
SEIKO EPSON CORPORATION
Hidekazu MAEZAWA
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF ACQUIRING ERROR CORRECTION VALUE OF REFERENCE FREQUENCY,...
Publication number
20080068258
Publication date
Mar 20, 2008
SEIKO EPSON CORPORATION
Hidekazu MAEZAWA
G01 - MEASURING TESTING
Information
Patent Application
Portable information processing apparatus
Publication number
20010029588
Publication date
Oct 11, 2001
Akiyoshi Nakamura
G01 - MEASURING TESTING