Hidekazu Yamamoto

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device including a gettering layer and manufacturing...
- Patent number 8,329,563
- Issue date Dec 11, 2012
- Mitsubishi Denki Kabushiki Kaisha
- Tadaharu Minato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing SOI wafer
- Patent number 6,844,242
- Issue date Jan 18, 2005
- Renesas Technology Corp.
- Hideki Naruoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer shape evaluating method and device producing method, wafer an...
- Patent number 6,828,163
- Issue date Dec 7, 2004
- Shin-Etsu Handotai Co., Ltd.
- Makoto Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer with a dicing line overlapping a defect
- Patent number 6,747,337
- Issue date Jun 8, 2004
- Renesas Technology Corp.
- Hidekazu Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate for epitaxial growth
- Patent number 6,461,447
- Issue date Oct 8, 2002
- Mitsubish Denki Kabushiki Kaisha
- Hiroshi Shinyashiki
- C30 - CRYSTAL GROWTH
Information Patent Grant
Semiconductor device
- Patent number 6,399,460
- Issue date Jun 4, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Yasuo Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for processing semiconductor substrate
- Patent number 6,319,331
- Issue date Nov 20, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Morihiko Kume
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with high gettering capability to impurity pre...
- Patent number 6,271,541
- Issue date Aug 7, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Yasuo Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and semiconductor storage device
- Patent number 6,252,294
- Issue date Jun 26, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Nobuyoshi Hattori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crystal orientation detectable semiconductor substrate, and methods...
- Patent number 5,876,819
- Issue date Mar 2, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Yasuhiro Kimura
- C30 - CRYSTAL GROWTH
Information Patent Grant
Solid state image sensor and a driving method thereof
- Patent number 5,539,461
- Issue date Jul 23, 1996
- Nippon Hoso Kyokai
- Fumihiko Andoh
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method of manufacturing a camera device
- Patent number 5,466,613
- Issue date Nov 14, 1995
- Nippon Hoso Kyokai
- Fumihiko Andoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Camera device and method of manufacturing the same
- Patent number 5,399,882
- Issue date Mar 21, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Fumihiko Andoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid-state imaging array including focusing elements
- Patent number 5,371,397
- Issue date Dec 6, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Shigeto Maegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photoelectric converter with electron injection preventive layer
- Patent number 5,311,038
- Issue date May 10, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Hidekazu Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making solid-state imaging device
- Patent number 5,238,864
- Issue date Aug 24, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Shigeto Maegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid-state imaging device with improved photodetector
- Patent number 5,191,399
- Issue date Mar 2, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Shigeto Maegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid-state image sensor
- Patent number 5,040,038
- Issue date Aug 13, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Naoki Yutani
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND PROCESS FOR PRODUCING THE SAME
- Publication number 20090267191
- Publication date Oct 29, 2009
- MITSUBISHI ELECTRIC CORPORATION
- Tadaharu Minato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Wafer shape evaluating method and device producing method, wafer an...
- Publication number 20030023402
- Publication date Jan 30, 2003
- Makoto Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing SOI wafer
- Publication number 20030013273
- Publication date Jan 16, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Hideki Naruoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE WITH HIGH GETTERING CAPABILITY TO IMPURITY PRE...
- Publication number 20010002704
- Publication date Jun 7, 2001
- YASUO YAMAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS

Hidekazu Yamamoto

Person

Patents Grantslast 30 patents

Semiconductor device including a gettering layer and manufacturing...

Method of manufacturing SOI wafer

Wafer shape evaluating method and device producing method, wafer an...

Semiconductor wafer with a dicing line overlapping a defect

Substrate for epitaxial growth

Semiconductor device

Method for processing semiconductor substrate

Semiconductor device with high gettering capability to impurity pre...

Semiconductor device and semiconductor storage device

Crystal orientation detectable semiconductor substrate, and methods...

Solid state image sensor and a driving method thereof

Method of manufacturing a camera device

Camera device and method of manufacturing the same

Solid-state imaging array including focusing elements

Photoelectric converter with electron injection preventive layer

Method of making solid-state imaging device

Solid-state imaging device with improved photodetector

Solid-state image sensor

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND PROCESS FOR PRODUCING THE SAME

Wafer shape evaluating method and device producing method, wafer an...

Method of manufacturing SOI wafer

SEMICONDUCTOR DEVICE WITH HIGH GETTERING CAPABILITY TO IMPURITY PRE...