Hidekazu YAMAZAKI

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe, inspection jig, inspection device, and method for manufactur...
- Patent number 11,454,650
- Issue date Sep 27, 2022
- Nidec-Read Corporation
- Hidekazu Yamazaki
- G01 - MEASURING TESTING
Information Patent Grant
Inspection jig provided with probe, substrate inspection device pro...
- Patent number 10,914,758
- Issue date Feb 9, 2021
- Nidec-Read Corporation
- Hidekazu Yamazaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE, INSPECTION JIG, INSPECTION DEVICE, AND METHOD FOR MANUFACTUR...
- Publication number 20210132112
- Publication date May 6, 2021
- Hidekazu YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION JIG, METHOD FOR MANUFACTURING INSPECTION JIG, AND INSPEC...
- Publication number 20200200797
- Publication date Jun 25, 2020
- NIDEC-READ CORPORATION
- Hidekazu YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
PROBE STRUCTURE AND METHOD FOR PRODUCING PROBE STRUCTURE
- Publication number 20200041543
- Publication date Feb 6, 2020
- NIDEC-READ CORPORATION
- Michihisa MAEDA
- B82 - NANO-TECHNOLOGY
Information Patent Application
INSPECTION JIG, SUBSTRATE INSPECTION DEVICE PROVIDED WITH SAME, AND...
- Publication number 20190271722
- Publication date Sep 5, 2019
- NIDEC-READ CORPORATION
- Hidekazu YAMAZAKI
- G01 - MEASURING TESTING