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Hideki FURUKAWA
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Kanagawa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Sensor, sensor substrate, and sensor manufacturing method
Patent number
11,231,298
Issue date
Jan 25, 2022
NSK Ltd.
Tomoyuki Yanagisawa
G01 - MEASURING TESTING
Information
Patent Grant
Sensor
Patent number
10,670,430
Issue date
Jun 2, 2020
NSK Ltd.
Tomoyuki Yanagisawa
G01 - MEASURING TESTING
Information
Patent Grant
Sensor manufacturing method and sensor
Patent number
10,458,817
Issue date
Oct 29, 2019
NSK Ltd.
Tomoyuki Yanagisawa
G01 - MEASURING TESTING
Information
Patent Grant
Target substance capturing device
Patent number
10,379,111
Issue date
Aug 13, 2019
NSK Ltd.
Keisuke Yokoyama
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Sensor having generating and detecting units on a substrate with a...
Patent number
10,378,932
Issue date
Aug 13, 2019
NSK Ltd.
Yasuhiro Kawai
G01 - MEASURING TESTING
Information
Patent Grant
Sensor and method of manufacturing sensor
Patent number
10,337,892
Issue date
Jul 2, 2019
NSK Ltd.
Yasuhiro Kawai
G01 - MEASURING TESTING
Information
Patent Grant
Optical sensor
Patent number
10,139,252
Issue date
Nov 27, 2018
NSK Ltd.
Yasuhiro Kawai
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
SENSOR, SENSOR SUBSTRATE, AND SENSOR MANUFACTURING METHOD
Publication number
20210180996
Publication date
Jun 17, 2021
NSK Ltd.
Tomoyuki YANAGISAWA
G01 - MEASURING TESTING
Information
Patent Application
SENSOR
Publication number
20190162563
Publication date
May 30, 2019
NSK Ltd.
Tomoyuki YANAGISAWA
G01 - MEASURING TESTING
Information
Patent Application
SENSOR MANUFACTURING METHOD AND SENSOR
Publication number
20190078911
Publication date
Mar 14, 2019
NSK Ltd.
Tomoyuki YANAGISAWA
G01 - MEASURING TESTING
Information
Patent Application
SENSOR AND METHOD OF MANUFACTURING SENSOR
Publication number
20170254678
Publication date
Sep 7, 2017
NSK Ltd.
Yasuhiro KAWAI
G01 - MEASURING TESTING
Information
Patent Application
SENSOR AND METHOD OF MANUFACTURING SENSOR
Publication number
20170219389
Publication date
Aug 3, 2017
NSK Ltd.
Yasuhiro KAWAI
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SENSOR
Publication number
20170219388
Publication date
Aug 3, 2017
NSK LTD.
Yasuhiro KAWAI
G01 - MEASURING TESTING
Information
Patent Application
TARGET SUBSTANCE CAPTURING DEVICE AND TARGET SUBSTANCE DETECTING DE...
Publication number
20160069798
Publication date
Mar 10, 2016
NSK LTD.
Keisuke YOKOYAMA
G01 - MEASURING TESTING
Information
Patent Application
TARGET SUBSTANCE CAPTURING DEVICE
Publication number
20160061823
Publication date
Mar 3, 2016
NSK Ltd.
Keisuke YOKOYAMA
G01 - MEASURING TESTING
Information
Patent Application
TARGET SUBSTANCE DETECTING APPARATUS, AND TARGET SUBSTANCE DETECTIN...
Publication number
20130230931
Publication date
Sep 5, 2013
NSK LTD.
Keisuke Yokoyama
B82 - NANO-TECHNOLOGY