Hideki HIRAKAWA

Person

Aomori, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electrical test probe
- Patent number 9,568,500
- Issue date Feb 14, 2017
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Grant
Electrical test probe and probe assembly with improved probe tip
- Patent number 8,975,908
- Issue date Mar 10, 2015
- Kabushiki Kaisha Nihon Micronics
- Takayuki Hayashizaki
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a probe for an electrical test
- Patent number 8,671,567
- Issue date Mar 18, 2014
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Grant
Contactor for electrical test, electrical connecting apparatus usin...
- Patent number 7,960,988
- Issue date Jun 14, 2011
- Kabushiki Kaisha Nihon Micronics
- Yoshiyuki Fukami
- G01 - MEASURING TESTING
Information Patent Grant
Current test probe having a solder guide portion, and related probe...
- Patent number 7,888,958
- Issue date Feb 15, 2011
- Kabushiki Kaisha Nihon Micronics
- Akira Souma
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a probe
- Patent number 7,862,733
- Issue date Jan 4, 2011
- Kabushiki Kaisha Nihon Micronics
- Takayuki Hayashizaki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Contact for electrical test, electrical connecting apparatus using...
- Patent number 7,816,931
- Issue date Oct 19, 2010
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing an electrical test probe
- Patent number 7,736,690
- Issue date Jun 15, 2010
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a probe
- Patent number 7,721,429
- Issue date May 25, 2010
- Kabushiki Kaisha Nihon Micronics
- Akira Soma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe for electrical test and electrical connecting apparatus using it
- Patent number 7,679,389
- Issue date Mar 16, 2010
- Kabushiki Kaisha Nihon Micronics
- Shinji Kuniyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Electrical test probe
- Patent number 7,629,807
- Issue date Dec 8, 2009
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Grant
Electrical test probe and electrical test probe assembly
- Patent number 7,586,321
- Issue date Sep 8, 2009
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Grant
Probe for electrical test and probe assembly
- Patent number 7,557,593
- Issue date Jul 7, 2009
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a probe
- Patent number 7,523,539
- Issue date Apr 28, 2009
- Kabushiki Kaisha Nihon Micronics
- Takayuki Hayashizaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRICAL TEST PROBE
- Publication number 20130321016
- Publication date Dec 5, 2013
- Kabushiki Kaisha Nihon Micronics
- Hideki HIRAKAWA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL TEST PROBE AND PROBE ASSEMBLY
- Publication number 20120068726
- Publication date Mar 22, 2012
- Kabushiki Kaisha Nihon Micronics
- Takayuki HAYASHIZAKI
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR ELECTRICAL TEST, ELECTRICAL CONNECTING APPARATUS USING TH...
- Publication number 20110115515
- Publication date May 19, 2011
- Kabushiki Kaisha Nihon Micronics
- Hideki HIRAKAWA
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR CURRENT TEST, PROBE ASSEMBLY AND PRODUCTION METHOD THEREOF
- Publication number 20100213956
- Publication date Aug 26, 2010
- KABUSHIKI KAISHA NIHON MICRONICS
- Akira Souma
- G01 - MEASURING TESTING
Information Patent Application
CONTACT FOR ELECTRICAL TEST, ELECTRICAL CONNECTING APPARATUS USING...
- Publication number 20090230982
- Publication date Sep 17, 2009
- Kabushiki Kaisha Nihon Micronics
- Hideki HIRAKAWA
- G01 - MEASURING TESTING
Information Patent Application
CONTACTOR FOR ELECTRICAL TEST, ELECTRICAL CONNECTING APPARATUS USIN...
- Publication number 20090160473
- Publication date Jun 25, 2009
- Kabushiki Kaisha Nihon Micronics
- Yoshiyuki FUKAMI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL TEST PROBE
- Publication number 20090058441
- Publication date Mar 5, 2009
- KABUSHIKI KAISHA NIHON MICRONICS
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR ELECTRICAL TEST AND ELECTRICAL CONNECTING APPARATUS USING IT
- Publication number 20090051382
- Publication date Feb 26, 2009
- Kabushiki Kaisha Nihon Micronics
- Shinji KUNIYOSHI
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR ELECTRICAL TEST
- Publication number 20090009197
- Publication date Jan 8, 2009
- Kabushiki Kaisha Nihon Micronics
- Hideki HIRAKAWA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING A PROBE
- Publication number 20080210663
- Publication date Sep 4, 2008
- Kabushiki Kaisha Nihon Micronics
- Takayuki HAYASHIZAKI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PROBE AND PROBE ASSEMBLY
- Publication number 20080191727
- Publication date Aug 14, 2008
- Kabushiki Kaisha Nihon Micronics
- Yuko YAMADA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING A PROBE
- Publication number 20080184559
- Publication date Aug 7, 2008
- Kabushiki Kaisha Nihon Micronics
- Akira SOMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICAL TEST PROBE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20080186038
- Publication date Aug 7, 2008
- Kabushiki Kaisha Nihon Micronics
- Hideki HIRAKAWA
- G01 - MEASURING TESTING
Information Patent Application
PROBE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20080143368
- Publication date Jun 19, 2008
- Kabushiki Kaisha Nihon Micronics
- Takayuki HAYASHIZAKI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL TEST PROBE AND ELECTRICAL TEST PROBE ASSEMBLY
- Publication number 20080074128
- Publication date Mar 27, 2008
- Kabushiki Kaisha Nihon Micronics
- Hideki HIRAKAWA
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR ELECTRICAL TEST AND PROBE ASSEMBLY
- Publication number 20070210813
- Publication date Sep 13, 2007
- KABUSHIKI KAISHA NIHON MICRONICS
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Application
Probe use in electric test
- Publication number 20070018633
- Publication date Jan 25, 2007
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING

Hideki HIRAKAWA

Person

Patents Grantslast 30 patents

Electrical test probe

Electrical test probe and probe assembly with improved probe tip

Method for manufacturing a probe for an electrical test

Contactor for electrical test, electrical connecting apparatus usin...

Current test probe having a solder guide portion, and related probe...

Method for manufacturing a probe

Contact for electrical test, electrical connecting apparatus using...

Method for manufacturing an electrical test probe

Method for manufacturing a probe

Probe for electrical test and electrical connecting apparatus using it

Electrical test probe

Electrical test probe and electrical test probe assembly

Probe for electrical test and probe assembly

Method of manufacturing a probe

Patents Applicationslast 30 patents

ELECTRICAL TEST PROBE

ELECTRICAL TEST PROBE AND PROBE ASSEMBLY

PROBE FOR ELECTRICAL TEST, ELECTRICAL CONNECTING APPARATUS USING TH...

PROBE FOR CURRENT TEST, PROBE ASSEMBLY AND PRODUCTION METHOD THEREOF

CONTACT FOR ELECTRICAL TEST, ELECTRICAL CONNECTING APPARATUS USING...

CONTACTOR FOR ELECTRICAL TEST, ELECTRICAL CONNECTING APPARATUS USIN...

ELECTRICAL TEST PROBE

PROBE FOR ELECTRICAL TEST AND ELECTRICAL CONNECTING APPARATUS USING IT

PROBE FOR ELECTRICAL TEST

METHOD FOR MANUFACTURING A PROBE

PROBE AND PROBE ASSEMBLY

METHOD FOR MANUFACTURING A PROBE

ELECTRICAL TEST PROBE AND METHOD FOR MANUFACTURING THE SAME

PROBE AND METHOD FOR MANUFACTURING THE SAME

ELECTRICAL TEST PROBE AND ELECTRICAL TEST PROBE ASSEMBLY

PROBE FOR ELECTRICAL TEST AND PROBE ASSEMBLY

Probe use in electric test