Hideki Hirota

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample device for charged particle beam
- Patent number 8,729,497
- Issue date May 20, 2014
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fixation device for a sample case for an electron microscope
- Patent number D660335
- Issue date May 22, 2012
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- D16 - Photography and optical equipment
Information Patent Grant
Sample case for an electron microscope
- Patent number D651226
- Issue date Dec 27, 2011
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- D16 - Photography and optical equipment

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE DEVICE FOR CHARGED PARTICLE BEAM
- Publication number 20130193343
- Publication date Aug 1, 2013
- Yasuhira Nagakubo
- H01 - BASIC ELECTRIC ELEMENTS