Hideki Ichikawa

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electronic component handling device and electronic component testi...
- Patent number 11,372,021
- Issue date Jun 28, 2022
- Advantest Corporation
- Takatoshi Yoshino
- G05 - CONTROLLING REGULATING
Information Patent Grant
Electronic component handling device and electronic component testi...
- Patent number 11,340,638
- Issue date May 24, 2022
- Advantest Corporation
- Hirotaka Sasaki
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC COMPONENT HANDLING DEVICE AND ELECTRONIC COMPONENT TESTI...
- Publication number 20200241040
- Publication date Jul 30, 2020
- Advantest Corporation
- Takatoshi Yoshino
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT HANDLING DEVICE AND ELECTRONIC COMPONENT TESTI...
- Publication number 20200241582
- Publication date Jul 30, 2020
- Advantest Corporation
- Hirotaka Sasaki
- G01 - MEASURING TESTING