Hideki Kawakatsu

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Dynamic mode AFM apparatus
- Patent number 8,151,368
- Issue date Apr 3, 2012
- Japan Science and Technology Agency
- Hideki Kawakatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope apparatus
- Patent number 7,904,966
- Issue date Mar 8, 2011
- Japan Science and Technology Agency
- Dai Kobayashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Parametric resonator and filter using the same
- Patent number 7,880,364
- Issue date Feb 1, 2011
- Panasonic Corporation
- Kunihiko Nakamura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Homodyne laser interferometer probe and displacement measurement sy...
- Patent number 7,847,953
- Issue date Dec 7, 2010
- Japan Science and Technology Agency
- Hideki Kawakatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and device for precisely resisting and moving high load
- Patent number 7,834,519
- Issue date Nov 16, 2010
- Japan Science and Technology Agency
- Hideki Kawakatsu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Torsional resonator and filter using this
- Patent number 7,741,932
- Issue date Jun 22, 2010
- Panasonic Corporation
- Kunihiko Nakamura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Heterodyne laser doppler probe and measurement system using the same
- Patent number 7,719,663
- Issue date May 18, 2010
- Japan Science and Technology Agency
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device with daisy type cantilever wheel
- Patent number 7,694,347
- Issue date Apr 6, 2010
- Japan Science and Technology Agency
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for precisely resisting and moving high load
- Patent number 7,622,847
- Issue date Nov 24, 2009
- Japan Science and Technology Agency
- Hideki Kawakatsu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Interferometric apparatus utilizing a cantilever array to measure a...
- Patent number 7,545,508
- Issue date Jun 9, 2009
- The Foundation for the Promotion of Industrial Science
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever array, method for fabricating the same, scanning probe m...
- Patent number 7,411,189
- Issue date Aug 12, 2008
- The Foundation for the Promotion of Industrial Science
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Grant
Torsion resonator and filter using this
- Patent number 7,358,648
- Issue date Apr 15, 2008
- Matsushita Electric Industrial Co., Ltd.
- Kunihiko Nakamura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Cantilever array, method for fabricating the same, scanning probe m...
- Patent number 7,309,863
- Issue date Dec 18, 2007
- Japan Science and Technology Agency
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional structural body composed of silicon fine wire, it...
- Patent number 7,297,568
- Issue date Nov 20, 2007
- Japan Science and Technology Agency
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever array and scanning probe microscope including a sliding,...
- Patent number 7,220,962
- Issue date May 22, 2007
- Japan Science and Technology Agency
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Grant
Nanometer-order mechanical vibrator, production method thereof and...
- Patent number 6,611,178
- Issue date Aug 26, 2003
- Japan Science and Technology Corporation
- Hideki Kawakatsu
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DYNAMIC MODE AFM APPARATUS
- Publication number 20110055983
- Publication date Mar 3, 2011
- Japan Science and Technology Agency
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR PRECISELY RESISTING AND MOVING HIGH LOAD
- Publication number 20100060105
- Publication date Mar 11, 2010
- Japan Science and Technology Agency
- Hideki Kawakatsu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MECHANICAL VIBRATOR AND PRODUCTION METHOD THEREFOR
- Publication number 20090320167
- Publication date Dec 24, 2009
- Japan Science and Technology Agency
- Dai Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE APPARATUS
- Publication number 20090261249
- Publication date Oct 22, 2009
- JAPAN SCIENCE AND TECHNOLOGY AGENCY
- Dai Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
TORTIONAL RESONATOR AND FILTER USING THIS
- Publication number 20090224850
- Publication date Sep 10, 2009
- Matsushita Electric Industrial Co., Ltd.
- Kunihiko Nakamura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
HETERODYNE LASER DOPPLER PROBE AND MEASUREMENT SYSTEM USING THE SAME
- Publication number 20090219506
- Publication date Sep 3, 2009
- Japan Science and Technology Agency
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE WITH DAISY TYPE CANTILEVER WHEEL
- Publication number 20090138994
- Publication date May 28, 2009
- Japan Science and Technology Agency
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Application
HOMODYNE LASER INTERFEROMETER PROBE AND DISPLACEMENT MEASUREMENT SY...
- Publication number 20090079990
- Publication date Mar 26, 2009
- Japan Science and Technology Agency
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Application
Highly Sensitive Force/Mass Detection Method and Device Using Phase...
- Publication number 20080252385
- Publication date Oct 16, 2008
- Japan Science and Technology Agency
- Shigeki Kawai
- G01 - MEASURING TESTING
Information Patent Application
Method and Device for Precisely Resisting and Moving High Load
- Publication number 20080088205
- Publication date Apr 17, 2008
- Japan Science and Technology Agency
- Hideki Kawakatsu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Fm signal demodulation method and device thereof
- Publication number 20070197176
- Publication date Aug 23, 2007
- Japan Science and Technology Agency
- Dai Kobayashi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Torsion resonator and filter using this
- Publication number 20070188272
- Publication date Aug 16, 2007
- Kunihiko Nakamura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PARAMETRIC RESONATOR AND FILTER USING THE SAME
- Publication number 20070176701
- Publication date Aug 2, 2007
- Matsushita Electric Industrial Co., Ltd.
- Kunihiko Nakamura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Probe for probe microscope using transparent substrate, method of p...
- Publication number 20070158554
- Publication date Jul 12, 2007
- JAPAN SCIENCE AND TECHNOLOGY AGENCY
- Dai Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
Nanogap series substance capturing, detecting and identifying metho...
- Publication number 20070140905
- Publication date Jun 21, 2007
- Japan Science and Technology Agency
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Application
Probe for scanning probe microscope and method of producing the same
- Publication number 20070108159
- Publication date May 17, 2007
- Japan Science and Technology Agency
- Dai Kobayashi
- G01 - MEASURING TESTING
Information Patent Application
Cantilever array, method for fabricating the same, scanning probe m...
- Publication number 20070018096
- Publication date Jan 25, 2007
- Japan Science and Technology Agency
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Application
Three-dimensional structure composed of silicon fine wires, method...
- Publication number 20060273445
- Publication date Dec 7, 2006
- Japan Science and Technology Agency
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Application
Cantilever array, method for fabricating the same, scanning probe m...
- Publication number 20060253943
- Publication date Nov 9, 2006
- Japan Science and Technology Agency
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Application
Cantilever array, method for fabricating the same, scanning probe m...
- Publication number 20060231757
- Publication date Oct 19, 2006
- Japan Science and Technology Agency
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and device for measuring vibration frequency of multi-cantil...
- Publication number 20060162455
- Publication date Jul 27, 2006
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Application
Three-dimensional structural body composed of silicon fine wire, it...
- Publication number 20050247998
- Publication date Nov 10, 2005
- Japan Science and Technology Agency
- Hideki Kawakatsu
- G01 - MEASURING TESTING
Information Patent Application
Cantilever array, method of manufacturing the array, and scanning p...
- Publication number 20040256552
- Publication date Dec 23, 2004
- Hideki Kawakatsu
- G01 - MEASURING TESTING

Hideki Kawakatsu

Person

Patents Grantslast 30 patents

Dynamic mode AFM apparatus

Scanning probe microscope apparatus

Parametric resonator and filter using the same

Homodyne laser interferometer probe and displacement measurement sy...

Method and device for precisely resisting and moving high load

Torsional resonator and filter using this

Heterodyne laser doppler probe and measurement system using the same

Measuring device with daisy type cantilever wheel

Method and device for precisely resisting and moving high load

Interferometric apparatus utilizing a cantilever array to measure a...

Cantilever array, method for fabricating the same, scanning probe m...

Torsion resonator and filter using this

Cantilever array, method for fabricating the same, scanning probe m...

Three-dimensional structural body composed of silicon fine wire, it...

Cantilever array and scanning probe microscope including a sliding,...

Nanometer-order mechanical vibrator, production method thereof and...

Patents Applicationslast 30 patents

DYNAMIC MODE AFM APPARATUS

METHOD AND DEVICE FOR PRECISELY RESISTING AND MOVING HIGH LOAD

MECHANICAL VIBRATOR AND PRODUCTION METHOD THEREFOR

SCANNING PROBE MICROSCOPE APPARATUS

TORTIONAL RESONATOR AND FILTER USING THIS

HETERODYNE LASER DOPPLER PROBE AND MEASUREMENT SYSTEM USING THE SAME

MEASURING DEVICE WITH DAISY TYPE CANTILEVER WHEEL

HOMODYNE LASER INTERFEROMETER PROBE AND DISPLACEMENT MEASUREMENT SY...

Highly Sensitive Force/Mass Detection Method and Device Using Phase...

Method and Device for Precisely Resisting and Moving High Load

Fm signal demodulation method and device thereof

Torsion resonator and filter using this

PARAMETRIC RESONATOR AND FILTER USING THE SAME

Probe for probe microscope using transparent substrate, method of p...

Nanogap series substance capturing, detecting and identifying metho...

Probe for scanning probe microscope and method of producing the same

Cantilever array, method for fabricating the same, scanning probe m...

Three-dimensional structure composed of silicon fine wires, method...

Cantilever array, method for fabricating the same, scanning probe m...

Cantilever array, method for fabricating the same, scanning probe m...

Method and device for measuring vibration frequency of multi-cantil...

Three-dimensional structural body composed of silicon fine wire, it...

Cantilever array, method of manufacturing the array, and scanning p...