Hideki MASUOKA

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Hamamatsu-shi, Shizuoka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Spectrometric device and spectrometric method
- Patent number 12,174,072
- Issue date Dec 24, 2024
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometric device and spectrometric method
- Patent number 11,892,352
- Issue date Feb 6, 2024
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometric device and spectrometric method
- Patent number 11,852,535
- Issue date Dec 26, 2023
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometric device and spectrometric method
- Patent number 11,828,653
- Issue date Nov 28, 2023
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECTROSCOPIC DEVICE, RAMAN SPECTROSCOPIC MEASUREMENT DEVICE, AND S...
- Publication number 20250189453
- Publication date Jun 12, 2025
- Hamamatsu Photonics K.K.
- Kazuya IGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRIC DEVICE AND SPECTROMETRIC METHOD
- Publication number 20240077360
- Publication date Mar 7, 2024
- HAMAMATSU PHOTONICS K. K.
- Kazuya IGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRIC DEVICE AND SPECTROMETRIC METHOD
- Publication number 20230147189
- Publication date May 11, 2023
- HAMAMATSU PHOTONICS K. K.
- Kazuya IGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRIC DEVICE AND SPECTROMETRIC METHOD
- Publication number 20220082439
- Publication date Mar 17, 2022
- Hamamatsu Photonics K.K.
- Kazuya IGUCHI
- G01 - MEASURING TESTING