Hideki Matsutori

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Patents Grantslast 30 patents

Information Patent Grant
Measuring device
- Patent number 7,187,454
- Issue date Mar 6, 2007
- Tokyo Seimitsu Co., Ltd.
- Hideki Matsutori
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring inner diameter dimension of works
- Patent number 7,055,373
- Issue date Jun 6, 2006
- Tokyo Seimitsu Co., Ltd.
- Hideki Matsutori
- G01 - MEASURING TESTING
Information Patent Grant
Inside diameter measuring method and apparatus
- Patent number 6,675,632
- Issue date Jan 13, 2004
- Tokyo Seimitsu Co., Ltd.
- Hideki Matsutori
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measuring device
- Publication number 20050225755
- Publication date Oct 13, 2005
- Tokyo Seimitsu Co., Ltd.
- Hideki Matsutori
- G01 - MEASURING TESTING
Information Patent Application
Inside diameter measuring method and apparatus
- Publication number 20030041468
- Publication date Mar 6, 2003
- TOKYO SEIMITSU CO., LTD.
- Hideki Matsutori
- G01 - MEASURING TESTING