Hideki MISHIMA

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Miyazaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus, control apparatus, and control method
- Patent number 12,078,478
- Issue date Sep 3, 2024
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stylus abrasion detection method and surface property measurement d...
- Patent number 9,052,182
- Issue date Jun 9, 2015
- Mitutoyo Corporation
- Hideki Mishima
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring instrument and measuring method
- Patent number 8,276,435
- Issue date Oct 2, 2012
- Mitutoyo Corporation
- Toshihiro Kanematsu
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring machine, leveling device for surface text...
- Patent number 6,745,616
- Issue date Jun 8, 2004
- Mitutoyo Corporation
- Minoru Katayama
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring apparatus
- Patent number 6,510,363
- Issue date Jan 21, 2003
- Mitutoyo Corporation
- Hiroyuki Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring apparatus
- Patent number 6,357,286
- Issue date Mar 19, 2002
- Mitutoyo Corporation
- Toshihiro Kanematsu
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT APPARATUS, CONTROL APPARATUS, AND CONTROL METHOD
- Publication number 20220155065
- Publication date May 19, 2022
- MITUTOYO CORPORATION
- Kazuhiko HIDAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STYLUS ABRASION DETECTION METHOD AND SURFACE PROPERTY MEASUREMENT D...
- Publication number 20120010826
- Publication date Jan 12, 2012
- MITUTOYO CORPORATION
- Hideki MISHIMA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE TEXTURE MEASURING INSTRUMENT AND MEASURING METHOD
- Publication number 20100018298
- Publication date Jan 28, 2010
- Mitutoyo Corporation
- Toshihiro Kanematsu
- G01 - MEASURING TESTING