Hideki Mori

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number RE50035
- Issue date Jul 9, 2024
- Sony Group Corporation
- Hideki Mori
Information Patent Grant
Information processing device, information processing method, and p...
- Patent number 11,943,519
- Issue date Mar 26, 2024
- Sony Interactive Entertainment Inc.
- Kazuyuki Arimatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Control apparatus, information processing system, control method, a...
- Patent number 11,501,552
- Issue date Nov 15, 2022
- Sony Interactive Entertainment Inc.
- Hideki Mori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrostatic protective device and electrostatic protective circuit
- Patent number 10,361,183
- Issue date Jul 23, 2019
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Hideki Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate treatment method and substrate treatment apparatus
- Patent number 10,319,602
- Issue date Jun 11, 2019
- Shibaura Mechatronics Corporation
- Nobuo Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Swing-open type package
- Patent number 8,925,794
- Issue date Jan 6, 2015
- Japan Tobacco Inc.
- Shunsuke Tawada
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Semiconductor device
- Patent number 8,803,244
- Issue date Aug 12, 2014
- Sony Corporation
- Hideki Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 8,716,811
- Issue date May 6, 2014
- Sony Corporation
- Hideki Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Feature analyzing apparatus for a surface of an object
- Patent number 8,700,498
- Issue date Apr 15, 2014
- Shibaura Mechatronics Corporation
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Substrate surface inspecting apparatus and substrate surface inspec...
- Patent number 8,508,246
- Issue date Aug 13, 2013
- Shibaura Mechatronics Corporation
- Hiroshi Wakaba
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method based on captured image and inspection device
- Patent number 8,497,985
- Issue date Jul 30, 2013
- Shibaura Mechatronics Corporation
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device for disk-shaped substrate
- Patent number 8,488,867
- Issue date Jul 16, 2013
- Shibaura Mechatronics Corporation
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Surface roughness inspection system
- Patent number 8,433,102
- Issue date Apr 30, 2013
- Shibaura Mechatronics Corporation
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Information processing apparatus and method, and program
- Patent number 8,300,954
- Issue date Oct 30, 2012
- Sony Corporation
- Yuya Aoki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing apparatus for converting a lower resolution image...
- Patent number 8,264,600
- Issue date Sep 11, 2012
- Sony Corporation
- Tetsujiro Kondo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor device and manufacturing method of the same
- Patent number 8,227,314
- Issue date Jul 24, 2012
- Sony Corporation
- Hideki Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image processing device, image processing method, learning device,...
- Patent number 8,208,735
- Issue date Jun 26, 2012
- Sony Corporation
- Kentaro Fukazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for inspecting edge of semiconductor wafer
- Patent number 8,194,241
- Issue date Jun 5, 2012
- Shibaura Mechatronics Corporation
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Image processing apparatus and method and program
- Patent number 8,111,325
- Issue date Feb 7, 2012
- Sony Corporation
- Tetsujiro Kondo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Disc wafer inspecting device and inspecting method
- Patent number 8,107,064
- Issue date Jan 31, 2012
- Shibaura Mechatronics Corporation
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and manufacturing method of the same
- Patent number 8,097,914
- Issue date Jan 17, 2012
- Sony Corporation
- Hideki Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer containing cassette inspection device and method
- Patent number 8,094,923
- Issue date Jan 10, 2012
- Shibaura Mechatronics Corporation
- Yoshinori Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Coil support structure and magnetic disk drive
- Patent number 8,031,440
- Issue date Oct 4, 2011
- Hitachi Global Storage Technologies Netherlands B.V.
- Satoshi Matsumura
- G11 - INFORMATION STORAGE
Information Patent Grant
Surface inspection apparatus
- Patent number 8,023,111
- Issue date Sep 20, 2011
- Shibaura Mechatronics Corporation
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic discharge protection circuit
- Patent number 7,944,657
- Issue date May 17, 2011
- Sony Corporation
- Hideki Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 7,781,861
- Issue date Aug 24, 2010
- Sony Corporation
- Hideki Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 7,122,861
- Issue date Oct 17, 2006
- Sony Corporation
- Hideki Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory device, charge injection method th...
- Patent number 7,092,291
- Issue date Aug 15, 2006
- Sony Corporation
- Hideki Mori
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and method of fabricating same
- Patent number 7,015,551
- Issue date Mar 21, 2006
- Sony Corporation
- Kenichi Ookubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of fabricating same
- Patent number 7,009,259
- Issue date Mar 7, 2006
- Sony Corporation
- Kenichi Ookubo
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
- Publication number 20240252924
- Publication date Aug 1, 2024
- Sony Interactive Entertainment Inc.
- Makoto Wakabayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING DEVICE, CONTR...
- Publication number 20240087156
- Publication date Mar 14, 2024
- Sony Interactive Entertainment Inc.
- Hideki Mori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSING LIQUID SUPPLY DEVICE, SUBSTRATE PROCESSING APPARATUS, AN...
- Publication number 20230307263
- Publication date Sep 28, 2023
- SHIBAURA MECHATRONICS CORPORATION
- Masaaki FURUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESSING LIQUID SUPPLY DEVICE, SUBSTRATE PROCESSING APPARATUS, AN...
- Publication number 20230286013
- Publication date Sep 14, 2023
- SHIBAURA MECHATRONICS CORPORATION
- Masaaki FURUYA
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
DISPLAY APPARATUS, DISPLAY METHOD, AND COMPUTER PROGRAM
- Publication number 20230148052
- Publication date May 11, 2023
- Sony Interactive Entertainment Inc.
- Masaomi Nishidate
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
SUPPLY DEVICE AND SUPPLY SYSTEM
- Publication number 20230081295
- Publication date Mar 16, 2023
- SHIBAURA MECHATRONICS CORPORATION
- Masaaki FURUYA
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
SUPPLY TANK, SUPPLY DEVICE AND SUPPLY SYSTEM
- Publication number 20230077617
- Publication date Mar 16, 2023
- SHIBAURA MECHATRONICS CORPORATION
- Masaaki FURUYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND P...
- Publication number 20220294935
- Publication date Sep 15, 2022
- Sony Interactive Entertainment Inc.
- Kazuyuki ARIMATSU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROL APPARATUS, INFORMATION PROCESSING SYSTEM, CONTROL METHOD, A...
- Publication number 20210117663
- Publication date Apr 22, 2021
- Sony Interactive Entertainment Inc.
- Hideki Mori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RDB SYSTEM
- Publication number 20180357297
- Publication date Dec 13, 2018
- MEDIA DO HOLDINGS Co., Ltd.
- Hideki MORI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTROSTATIC PROTECTIVE DEVICE AND ELECTROSTATIC PROTECTIVE CIRCUIT
- Publication number 20170207212
- Publication date Jul 20, 2017
- Sony Semiconductor Solutions Corporation
- Hideki MORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE TREATMENT METHOD AND SUBSTRATE TREATMENT APPARATUS
- Publication number 20150093906
- Publication date Apr 2, 2015
- SHIBAURA MECHATRONICS CORPORATION
- Nobuo KOBAYASHI
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20130105911
- Publication date May 2, 2013
- SONY CORPORATION
- Hideki Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
- Publication number 20120267705
- Publication date Oct 25, 2012
- SONY CORPORATION
- Hideki Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20120248541
- Publication date Oct 4, 2012
- SONY CORPORATION
- Hideki Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
- Publication number 20120094452
- Publication date Apr 19, 2012
- SONY CORPORATION
- Hideki Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SWING-OPEN TYPE PACKAGE
- Publication number 20100320263
- Publication date Dec 23, 2010
- Shunsuke TAWADA
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
FEATURE ANALYZING APPARATUS
- Publication number 20100310150
- Publication date Dec 9, 2010
- Yoshinori Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE SURFACE INSPECTING APPARATUS AND SUBSTRATE SURFACE INSPEC...
- Publication number 20100310152
- Publication date Dec 9, 2010
- Shibaura Mechatronics Coporation
- Hiroshi Wakaba
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE FOR DISK-SHAPED SUBSTRATE
- Publication number 20100246934
- Publication date Sep 30, 2010
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD BASED ON CAPTURED IMAGE AND INSPECTION DEVICE
- Publication number 20100245810
- Publication date Sep 30, 2010
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Application
DISC WAFER INSPECTING DEVICE AND INSPECTING METHOD
- Publication number 20100177953
- Publication date Jul 15, 2010
- SHIBAURA MECHATRONICS CORPORATION
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Application
WAFER CONTAINING CASSETTE INSPECTION DEVICE AND METHOD
- Publication number 20100074514
- Publication date Mar 25, 2010
- Yoshinori Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR WAFER PROCESSING APPARATUS, REFERENCE ANGULAR POSITIO...
- Publication number 20100075442
- Publication date Mar 25, 2010
- Yoshinori Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE INSPECTION APPARATUS
- Publication number 20100066998
- Publication date Mar 18, 2010
- SHIBAURA MECHATRONICS CORPORATION
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Application
Manufacturing Equipment and Manufacturing Method of Membrane Electr...
- Publication number 20100051181
- Publication date Mar 4, 2010
- Toppan Printing Co., Ltd.
- Hideki Mori
- B32 - LAYERED PRODUCTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
- Publication number 20100052045
- Publication date Mar 4, 2010
- SONY CORPORATION
- Hideki Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING EDGE OF SEMICONDUCTOR WAFER
- Publication number 20100026997
- Publication date Feb 4, 2010
- Yoshinori Hayashi
- G01 - MEASURING TESTING
Information Patent Application
Visual Inspection System
- Publication number 20090304258
- Publication date Dec 10, 2009
- Yoshinori Hayashi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Information processing apparatus and method, and program
- Publication number 20090257661
- Publication date Oct 15, 2009
- SONY CORPORATION
- Yuya Aoki
- G06 - COMPUTING CALCULATING COUNTING

Hideki Mori

Person

Patents Grantslast 30 patents

Semiconductor device

Information processing device, information processing method, and p...

Control apparatus, information processing system, control method, a...

Electrostatic protective device and electrostatic protective circuit

Substrate treatment method and substrate treatment apparatus

Swing-open type package

Semiconductor device

Semiconductor device

Feature analyzing apparatus for a surface of an object

Substrate surface inspecting apparatus and substrate surface inspec...

Inspection method based on captured image and inspection device

Inspection device for disk-shaped substrate

Surface roughness inspection system

Information processing apparatus and method, and program

Image processing apparatus for converting a lower resolution image...

Semiconductor device and manufacturing method of the same

Image processing device, image processing method, learning device,...

Apparatus and method for inspecting edge of semiconductor wafer

Image processing apparatus and method and program

Disc wafer inspecting device and inspecting method

Semiconductor device and manufacturing method of the same

Wafer containing cassette inspection device and method

Coil support structure and magnetic disk drive

Surface inspection apparatus

Electrostatic discharge protection circuit

Semiconductor device

Semiconductor device and manufacturing method thereof

Nonvolatile semiconductor memory device, charge injection method th...

Semiconductor device and method of fabricating same

Semiconductor device and method of fabricating same

Patents Applicationslast 30 patents

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...

INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING DEVICE, CONTR...

PROCESSING LIQUID SUPPLY DEVICE, SUBSTRATE PROCESSING APPARATUS, AN...

PROCESSING LIQUID SUPPLY DEVICE, SUBSTRATE PROCESSING APPARATUS, AN...

DISPLAY APPARATUS, DISPLAY METHOD, AND COMPUTER PROGRAM

SUPPLY DEVICE AND SUPPLY SYSTEM

SUPPLY TANK, SUPPLY DEVICE AND SUPPLY SYSTEM

INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND P...

CONTROL APPARATUS, INFORMATION PROCESSING SYSTEM, CONTROL METHOD, A...

RDB SYSTEM

ELECTROSTATIC PROTECTIVE DEVICE AND ELECTROSTATIC PROTECTIVE CIRCUIT

SUBSTRATE TREATMENT METHOD AND SUBSTRATE TREATMENT APPARATUS

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME

SWING-OPEN TYPE PACKAGE

FEATURE ANALYZING APPARATUS

SUBSTRATE SURFACE INSPECTING APPARATUS AND SUBSTRATE SURFACE INSPEC...

INSPECTION DEVICE FOR DISK-SHAPED SUBSTRATE

INSPECTION METHOD BASED ON CAPTURED IMAGE AND INSPECTION DEVICE

DISC WAFER INSPECTING DEVICE AND INSPECTING METHOD

WAFER CONTAINING CASSETTE INSPECTION DEVICE AND METHOD

SEMICONDUCTOR WAFER PROCESSING APPARATUS, REFERENCE ANGULAR POSITIO...

SURFACE INSPECTION APPARATUS

Manufacturing Equipment and Manufacturing Method of Membrane Electr...

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME

APPARATUS AND METHOD FOR INSPECTING EDGE OF SEMICONDUCTOR WAFER

Visual Inspection System

Information processing apparatus and method, and program