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Hideki MORII
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Particle measurement device, three-dimensional shape measurement de...
Patent number
11,940,463
Issue date
Mar 26, 2024
Tokyo Seimitsu Co., Ltd.
Natsumi Hayashi
G01 - MEASURING TESTING
Information
Patent Grant
Measurement device
Patent number
11,859,969
Issue date
Jan 2, 2024
Tokyo Seimitsu Co., Ltd.
Hideki Morii
G01 - MEASURING TESTING
Information
Patent Grant
Inner surface shape measurement device, and alignment method and ma...
Patent number
11,740,072
Issue date
Aug 29, 2023
Tokyo Seimitsu Co., Ltd.
Hideki Morii
G01 - MEASURING TESTING
Information
Patent Grant
Inner surface shape measurement device, and alignment method for in...
Patent number
11,740,074
Issue date
Aug 29, 2023
Tokyo Seimitsu Co., Ltd.
Hideki Morii
G01 - MEASURING TESTING
Information
Patent Grant
Displacement detector, surface shape measuring apparatus, and round...
Patent number
11,435,175
Issue date
Sep 6, 2022
Tokyo Seimitsu Co., Ltd.
Hideki Morii
G01 - MEASURING TESTING
Information
Patent Grant
Displacement detector, surface shape measuring apparatus, and round...
Patent number
11,397,073
Issue date
Jul 26, 2022
Tokyo Seimitsu Co., Ltd.
Hideki Morii
G01 - MEASURING TESTING
Information
Patent Grant
Detector, surface property measuring machine, and roundness measuri...
Patent number
10,724,841
Issue date
Jul 28, 2020
Tokyo Seimitsu Co., Ltd.
Hideki Morii
G01 - MEASURING TESTING
Information
Patent Grant
Detector for surface measuring device
Patent number
10,571,238
Issue date
Feb 25, 2020
Tokyo Seimitsu Co., Ltd.
Hideki Morii
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PARTICLE MEASUREMENT DEVICE, THREE-DIMENSIONAL SHAPE MEASUREMENT DE...
Publication number
20230417797
Publication date
Dec 28, 2023
TOKYO SEIMITSU CO., LTD.
Natsumi HAYASHI
G01 - MEASURING TESTING
Information
Patent Application
SHAPE MEASUREMENT DEVICE AND METHOD FOR CONTROLLING SAME
Publication number
20230064860
Publication date
Mar 2, 2023
TOKYO SEIMITSU CO., LTD.
Hikaru MASUTA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASUREMENT DEVICE
Publication number
20230052870
Publication date
Feb 16, 2023
TOKYO SEIMITSU CO., LTD.
Hideki MORII
G01 - MEASURING TESTING
Information
Patent Application
INNER SURFACE SHAPE MEASUREMENT DEVICE, AND ALIGNMENT METHOD FOR IN...
Publication number
20230028748
Publication date
Jan 26, 2023
TOKYO SEIMITSU CO., LTD.
Hideki MORII
G01 - MEASURING TESTING
Information
Patent Application
INNER SURFACE SHAPE MEASUREMENT DEVICE, AND ALIGNMENT METHOD AND MA...
Publication number
20230003510
Publication date
Jan 5, 2023
TOKYO SEIMITSU CO., LTD.
Hideki MORII
G01 - MEASURING TESTING
Information
Patent Application
DISPLACEMENT DETECTOR, SURFACE SHAPE MEASURING APPARATUS, AND ROUND...
Publication number
20210285751
Publication date
Sep 16, 2021
TOKYO SEIMITSU CO., LTD.
Hideki MORII
G01 - MEASURING TESTING
Information
Patent Application
DETECTOR, SURFACE PROPERTY MEASURING MACHINE, AND ROUNDNESS MEASURI...
Publication number
20190368855
Publication date
Dec 5, 2019
TOKYO SEIMITSU CO., LTD.
Hideki MORII
G01 - MEASURING TESTING
Information
Patent Application
DETECTOR FOR SURFACE MEASURING DEVICE
Publication number
20190360793
Publication date
Nov 28, 2019
TOKYO SEIMITSU CO., LTD.
Hideki MORII
G01 - MEASURING TESTING