Hideki NEI

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Musashino-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe assembly for inspecting power semiconductor devices and inspe...
- Patent number 9,146,256
- Issue date Sep 29, 2015
- KABUSHIKI KAISHA NIHON MICRONICS
- Katsuo Yasuta
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus for semiconductor devices and chuck stage for...
- Patent number 9,069,008
- Issue date Jun 30, 2015
- Kabushiki Kaisha Nihon Micronics
- Katsuo Yasuta
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE ASSEMBLY FOR INSPECTING POWER SEMICONDUCTOR DEVICES AND INSPE...
- Publication number 20130141127
- Publication date Jun 6, 2013
- KABUSHIKI KAISHA NIHON MICRONICS
- Katsuo YASUTA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS FOR SEMICONDUCTOR DEVICES AND CHUCK STAGE USED...
- Publication number 20130141132
- Publication date Jun 6, 2013
- KABUSHIKI KAISHA NIHON MICRONICS
- Katsuo YASUTA
- G01 - MEASURING TESTING