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Gunma, JP
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Patents Grants
last 30 patents
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Patent Grant
Method of polishing silicon wafer and method of producing epitaxial...
Patent number
9,824,880
Issue date
Nov 21, 2017
Shin-Etsu Handotai Co., Ltd.
Hideki Sato
C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information
Patent Grant
Method for evaluating crystal defects of silicon wafer
Patent number
7,642,198
Issue date
Jan 5, 2010
Shin-Etsu Handotai Co., Ltd.
Hideki Sato
G01 - MEASURING TESTING
Information
Patent Grant
Method for evaluating semiconductor wafer and apparatus for evaluat...
Patent number
7,633,305
Issue date
Dec 15, 2009
Shin-Etsu Handotai Co., Ltd.
Tsuyoshi Ohtsuki
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for evaluating semiconductor wafer
Patent number
7,525,327
Issue date
Apr 28, 2009
Shin-Etsu Handotai Co., Ltd.
Tsuyoshi Ohtsuki
G01 - MEASURING TESTING
Information
Patent Grant
Silicon wafer for epitaxial wafer, epitaxial wafer, and method of m...
Patent number
6,626,994
Issue date
Sep 30, 2003
Shin-Etsu Handotai Co., Ltd.
Akihiro Kimura
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
METHOD OF POLISHING SILICON WAFER AND METHOD OF PRODUCING EPITAXIAL...
Publication number
20170194136
Publication date
Jul 6, 2017
Shin-Etsu Handotai Co., Ltd.
Hideki SATO
C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information
Patent Application
Method For Evaluating Soi Wafer
Publication number
20080054920
Publication date
Mar 6, 2008
Shin-Etsu Handotai Co., Ltd.
Tsuyoshi Ohtsuki
G01 - MEASURING TESTING
Information
Patent Application
Method For Evaluating Semiconductor Wafer And Apparatus For Evaluat...
Publication number
20070279080
Publication date
Dec 6, 2007
SHIN-ETSU HANDOTAI CO.,LTD
Tsuyoshi Ohtsuki
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for Evaluating Semiconductor Wafer
Publication number
20070273397
Publication date
Nov 29, 2007
Shin-Etsu Handotai Co., Ltd.
Tsuyoshi Ohtsuki
G01 - MEASURING TESTING