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Hideki Takiguchi
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Chiba-shi, JP
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last 30 patents
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Patent Grant
X-ray fluorescence analyzer and X-ray fluorescence analysis method
Patent number
8,611,493
Issue date
Dec 17, 2013
SII NanoTechnology Inc.
Kiyoshi Hasegawa
G01 - MEASURING TESTING
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last 30 patents
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X-RAY FLUORESCENCE ANALYZER AND X-RAY FLUORESCENCE ANALYSIS METHOD
Publication number
20120051507
Publication date
Mar 1, 2012
Kiyoshi Hasegawa
G01 - MEASURING TESTING