Hideki Tanji

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
Analyzer, method for cleaning photometry mechanism in such analyzer...
- Patent number 8,460,616
- Issue date Jun 11, 2013
- ARKRAY, Inc.
- Toshinori Fujiwara
- G01 - MEASURING TESTING
Information Patent Grant
Analysis method, analysis device and production method therefor
- Patent number 7,815,861
- Issue date Oct 19, 2010
- ARKRAY, Inc.
- Hideki Tanji
- G01 - MEASURING TESTING
Information Patent Grant
Centrifugal separator
- Patent number 7,150,858
- Issue date Dec 19, 2006
- ARKRAY, Inc.
- Takeshi Matsuda
- B04 - CENTRIFUGAL APPARATUS OR MACHINES FOR CARRYING-OUT PHYSICAL OR CHEMICAL...

Patents Applicationslast 30 patents

Information Patent Application
ANALYSIS METHOD, ANALYSIS DEVICE AND PRODUCTION METHOD THEREFOR
- Publication number 20110002813
- Publication date Jan 6, 2011
- ARKRAY, INC.
- Hideki Tanji
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS METHOD AND ANALYSIS APPARATUS
- Publication number 20090311797
- Publication date Dec 17, 2009
- ARKRAY, INC.
- Hideki Tanji
- G01 - MEASURING TESTING
Information Patent Application
Analyzer, method for cleaning photometry mechanism in such analyzer...
- Publication number 20090052033
- Publication date Feb 26, 2009
- Toshinori Fujiwara
- G01 - MEASURING TESTING
Information Patent Application
Analysis method, analysis device and production method therefor
- Publication number 20060153738
- Publication date Jul 13, 2006
- ARKRAY, INC.
- Hideki Tanji
- G01 - MEASURING TESTING
Information Patent Application
Centrifugal separator and analyzer with the separator
- Publication number 20030185710
- Publication date Oct 2, 2003
- Takeski Matsuda
- G01 - MEASURING TESTING