Hideki Toki

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device test board and method for evaluating semicondu...
- Patent number 6,114,866
- Issue date Sep 5, 2000
- Mitsubishi Electric Systems LSI Design Corporation
- Masaaki Matsuo
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit
- Patent number 6,092,227
- Issue date Jul 18, 2000
- Mitsubishi Electric System Lsi Design Corporation
- Hideki Toki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having improved bit line structure
- Patent number 5,973,953
- Issue date Oct 26, 1999
- Mitsubishi Electric System Lsi Design Corporation
- Takekazu Yamashita
- G11 - INFORMATION STORAGE