Hidemitsu Hakii

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Kuki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Display having sub-wavelength polygonal periodic elements
- Patent number 11,867,933
- Issue date Jan 9, 2024
- Toppan Printing Co., Ltd.
- Hidemitsu Hakii
- G02 - OPTICS
Information Patent Grant
Optical device, display body, device provided with a display body,...
- Patent number 11,097,568
- Issue date Aug 24, 2021
- Toppan Printing Co., Ltd.
- Masashi Kawashita
- B42 - BOOKBINDING ALBUMS FILES SPECIAL PRINTED MATTER
Information Patent Grant
Optical device, display body, device provided with a display body,...
- Patent number 11,059,318
- Issue date Jul 13, 2021
- Toppan Printing Co., Ltd.
- Masashi Kawashita
- B42 - BOOKBINDING ALBUMS FILES SPECIAL PRINTED MATTER
Information Patent Grant
Microstructure inspection method, microstructure inspection apparat...
- Patent number 8,754,935
- Issue date Jun 17, 2014
- Toppan Printing Co., Ltd.
- Isao Yonekura
- G01 - MEASURING TESTING
Information Patent Grant
Pattern-height measuring apparatus and pattern-height measuring method
- Patent number 8,604,431
- Issue date Dec 10, 2013
- Advantest Corp.
- Tsutomu Murakawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DISPLAY, DEVICE WITH DISPLAY, AND METHOD OF PRODUCING DISPLAY
- Publication number 20200284959
- Publication date Sep 10, 2020
- Toppan Printing Co., Ltd.
- Hidemitsu HAKII
- B42 - BOOKBINDING ALBUMS FILES SPECIAL PRINTED MATTER
Information Patent Application
OPTICAL DEVICE, DISPLAY BODY, DEVICE PROVIDED WITH A DISPLAY BODY,...
- Publication number 20190143736
- Publication date May 16, 2019
- Toppan Printing Co., Ltd.
- Masashi KAWASHITA
- G02 - OPTICS
Information Patent Application
PATTERN MEASUREMENT APPARATUS AND PATTERN MEASUREMENT METHOD
- Publication number 20120318976
- Publication date Dec 20, 2012
- Jun Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN-HEIGHT MEASURING APPARATUS AND PATTERN-HEIGHT MEASURING METHOD
- Publication number 20120217392
- Publication date Aug 30, 2012
- Tsutomu Murakawa
- G01 - MEASURING TESTING
Information Patent Application
MICROSTRUCTURE INSPECTION METHOD, MICROSTRUCTURE INSPECTION APPARAT...
- Publication number 20110001816
- Publication date Jan 6, 2011
- Toppan Printing Co., Ltd.
- Isao Yonekura
- G06 - COMPUTING CALCULATING COUNTING