Hidenobu MATSUMURA

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Gunma, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test carrier for mounting and testing an electronic device
- Patent number 9,817,024
- Issue date Nov 14, 2017
- Advantest Corporation
- Hidenobu Matsumura
- G01 - MEASURING TESTING
Information Patent Grant
Receiving apparatus, test apparatus, receiving method, and test method
- Patent number 8,604,773
- Issue date Dec 10, 2013
- Advantest Corporation
- Shusuke Kantake
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TEST CARRIER
- Publication number 20160003869
- Publication date Jan 7, 2016
- Advantest Corporation
- Hidenobu MATSUMURA
- G01 - MEASURING TESTING
Information Patent Application
RECEIVING APPARATUS, TEST APPARATUS, RECEIVING METHOD, AND TEST METHOD
- Publication number 20110115468
- Publication date May 19, 2011
- Advantest Corporation
- Shusuke KANTAKE
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device, test apparatus and measurement method therefor
- Publication number 20060150019
- Publication date Jul 6, 2006
- Advantest Corporation
- Makoto Yamazaki
- G01 - MEASURING TESTING