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Hidenori Kawai
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Saitama-ken, JP
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last 30 patents
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Patent Grant
Analyzing device
Patent number
7,270,995
Issue date
Sep 18, 2007
Nichirei Biosciences
Hirohisa Matsushita
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Analyzing device
Publication number
20030143639
Publication date
Jul 31, 2003
Hiroshisa Matsushita
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL