Hidenori Kitazume

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Filter, multiplexer and communication module
- Patent number 11,362,635
- Issue date Jun 14, 2022
- Taiyo Yuden Co., Ltd.
- Hidenori Kitazume
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Contactor and method of production of contactor
- Patent number 8,441,271
- Issue date May 14, 2013
- Advantest Corporation
- Hidenori Kitazume
- G01 - MEASURING TESTING
Information Patent Grant
Contactor, probe card, and method of mounting contactor
- Patent number 8,237,461
- Issue date Aug 7, 2012
- Advantest Corporation
- Hidenori Kitazume
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FILTER, MULTIPLEXER, AND MULTILAYER ELECTRONIC COMPONENT
- Publication number 20240333244
- Publication date Oct 3, 2024
- Taiyo Yuden Co., Ltd.
- Hidenori KITAZUME
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FILTER AND MULTIPLEXER
- Publication number 20230327632
- Publication date Oct 12, 2023
- Taiyo Yuden Co., Ltd.
- Hidenori KITAZUME
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FILTER, MULTIPLEXER AND COMMUNICATION MODULE
- Publication number 20210242850
- Publication date Aug 5, 2021
- Taiyo Yuden Co., Ltd.
- Hidenori KITAZUME
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PROBE STRUCTURE, PROBE APPARATUS, PROBE STRUCTURE MANUFACTURING MET...
- Publication number 20130038345
- Publication date Feb 14, 2013
- Advantest Corporation
- Hidenori Kitazume
- G01 - MEASURING TESTING
Information Patent Application
PROBE MANUFACTURING METHOD, PROBE STRUCTURE, PROBE APPARATUS, AND T...
- Publication number 20120161806
- Publication date Jun 28, 2012
- Advantest Corporation
- Hidenori Kitazume
- G01 - MEASURING TESTING
Information Patent Application
CONTACTOR, PROBE CARD, AND METHOD OF MOUNTING CONTACTOR
- Publication number 20100194420
- Publication date Aug 5, 2010
- Advantest Corporation
- Hidenori Kitazume
- G01 - MEASURING TESTING
Information Patent Application
CONTACTOR AND METHOD OF PRODUCTION OF CONTACTOR
- Publication number 20100102838
- Publication date Apr 29, 2010
- Advantest Corporation
- Hidenori Kitazume
- G01 - MEASURING TESTING
Information Patent Application
Probe card, production method thereof and repairing method of probe...
- Publication number 20090039904
- Publication date Feb 12, 2009
- Advantest Corporation
- Hidenori Kitazume
- G01 - MEASURING TESTING
Information Patent Application
Probe card, probe card manufacturing method, and contact
- Publication number 20030224627
- Publication date Dec 4, 2003
- Hidenori Kitazume
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Hidenori Kitazume

Person

Patents Grantslast 30 patents

Filter, multiplexer and communication module

Contactor and method of production of contactor

Contactor, probe card, and method of mounting contactor

Patents Applicationslast 30 patents

FILTER, MULTIPLEXER, AND MULTILAYER ELECTRONIC COMPONENT

FILTER AND MULTIPLEXER

FILTER, MULTIPLEXER AND COMMUNICATION MODULE

PROBE STRUCTURE, PROBE APPARATUS, PROBE STRUCTURE MANUFACTURING MET...

PROBE MANUFACTURING METHOD, PROBE STRUCTURE, PROBE APPARATUS, AND T...

CONTACTOR, PROBE CARD, AND METHOD OF MOUNTING CONTACTOR

CONTACTOR AND METHOD OF PRODUCTION OF CONTACTOR

Probe card, production method thereof and repairing method of probe...

Probe card, probe card manufacturing method, and contact