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Hidenori Miyazaki

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  • Ukyo-ku, Kyoto 616, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    TARGET DETECTING DEVICE
    • Publication number 20190257946
    • Publication date Aug 22, 2019
    • OMRON AUTOMOTIVE ELECTRONICS CO., LTD.
    • Keito Ando
    • G01 - MEASURING TESTING
  • Information Patent Application

    OBJECT DETECTION APPARATUS
    • Publication number 20190064327
    • Publication date Feb 28, 2019
    • OMRON AUTOMOTIVE ELECTRONICS CO., LTD.
    • Hoshibumi Ichiyanagi
    • G01 - MEASURING TESTING
  • Information Patent Application

    OBJECT DETECTION DEVICE
    • Publication number 20180156938
    • Publication date Jun 7, 2018
    • OMRON AUTOMOTIVE ELECTRONICS CO., LTD.
    • Naoki Otani
    • G01 - MEASURING TESTING
  • Information Patent Application

    LASER RADAR SYSTEM
    • Publication number 20180100738
    • Publication date Apr 12, 2018
    • OMRON AUTOMOTIVE ELECTRONICS CO., LTD.
    • Hoshibumi Ichiyanagi
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROJECTION OPTICAL SYSTEM AND OBJECT DETECTION DEVICE
    • Publication number 20180094793
    • Publication date Apr 5, 2018
    • OMRON AUTOMOTIVE ELECTRONICS CO., LTD.
    • Motomu Yokota
    • G01 - MEASURING TESTING
  • Information Patent Application

    LASER RADAR DEVICE
    • Publication number 20140293264
    • Publication date Oct 2, 2014
    • OMRON AUTOMOTIVE ELECTRONICS CO., LTD.
    • Hidenori Miyazaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    LASER RADAR DEVICE
    • Publication number 20140293267
    • Publication date Oct 2, 2014
    • OMRON AUTOMOTIVE ELECTRONICS CO., LTD.
    • Daisuke Itao
    • G01 - MEASURING TESTING
  • Information Patent Application

    Distance measuring device
    • Publication number 20070076186
    • Publication date Apr 5, 2007
    • OMRON CORPORATION
    • Hidenori Miyazaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Object detecting device and method
    • Publication number 20040065814
    • Publication date Apr 8, 2004
    • OMRON CORPORATION
    • Hidenori Miyazaki
    • G01 - MEASURING TESTING