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Hidenori Takahashi
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Kyoto City, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Mass spectrometry method and mass spectrometer
Patent number
12,111,285
Issue date
Oct 8, 2024
Shimadzu Corporation
Hidenori Takahashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion analysis device
Patent number
12,092,608
Issue date
Sep 17, 2024
Shimadzu Corporation
Hidenori Takahashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometry method and mass spectrometer
Patent number
12,051,580
Issue date
Jul 30, 2024
Shimadzu Corporation
Hidenori Takahashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion analyzer
Patent number
12,031,943
Issue date
Jul 9, 2024
Shimadzu Corporation
Hidenori Takahashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for analyzing isoaspartic acid and mass spectrometer
Patent number
12,020,919
Issue date
Jun 25, 2024
Shimadzu Corporation
Hidenori Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Ion analyzer
Patent number
11,908,671
Issue date
Feb 20, 2024
Shimadzu Corporation
Hidenori Takahashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometry method and mass spectrometer
Patent number
11,804,369
Issue date
Oct 31, 2023
Shimadzu Corporation
Hidenori Takahashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion analyzer
Patent number
11,735,408
Issue date
Aug 22, 2023
Shimadzu Corporation
Hidenori Takahashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Analytical device
Patent number
11,295,939
Issue date
Apr 5, 2022
Shimadzu Corporation
Hidenori Takahashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion analysis device and ion dissociation method
Patent number
11,075,067
Issue date
Jul 27, 2021
Shimadzu Corporation
Hidenori Takahashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion analyzer
Patent number
10,998,177
Issue date
May 4, 2021
Shimadzu Corporation
Hidenori Takahashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion trap mass spectrometry device and mass spectrometry method usin...
Patent number
10,510,524
Issue date
Dec 17, 2019
Shimadzu Corporation
Sadanori Sekiya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and device for analyzing protein or peptide
Patent number
10,317,412
Issue date
Jun 11, 2019
Shimadzu Corporation
Sadanori Sekiya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion analyzer including detector for detecting fragment ions generat...
Patent number
9,947,520
Issue date
Apr 17, 2018
Shimadzu Corporation
Hidenori Takahashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer and mass spectrometric method
Patent number
8,975,575
Issue date
Mar 10, 2015
Shimadzu Corporation
Sadanori Sekiya
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
Publication number
20240177980
Publication date
May 30, 2024
Shimadzu Corporation
Hidenori TAKAHASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTROMETRY METHOD AND MASS SPECTROMETER
Publication number
20240102962
Publication date
Mar 28, 2024
SHIMADZU CORPORATION
Hidenori TAKAHASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Mass Spectrometer and Mass Spectrometry Method
Publication number
20240038515
Publication date
Feb 1, 2024
SHIMADZU CORPORATION
Kazutaka MITSUI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTROMETRY METHOD AND MASS SPECTROMETER
Publication number
20240030016
Publication date
Jan 25, 2024
SHIMADZU CORPORATION
Hidenori TAKAHASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion Analyzer
Publication number
20230386814
Publication date
Nov 30, 2023
SHIMADZU CORPORATION
Masaji FURUTA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION ANALYSIS DEVICE
Publication number
20230048972
Publication date
Feb 16, 2023
SHIMADZU CORPORATION
Hidenori TAKAHASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION ANALYZER
Publication number
20220344140
Publication date
Oct 27, 2022
SHIMADZU CORPORATION
Hidenori TAKAHASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION ANALYZER
Publication number
20220260527
Publication date
Aug 18, 2022
SHIMADZU CORPORATION
Hidenori TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ANALYZING ISOASPARTIC ACID AND MASS SPECTROMETER
Publication number
20220254621
Publication date
Aug 11, 2022
SHIMADZU CORPORATION
Hidenori TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
MASS SPECTROMETRY METHOD AND MASS SPECTROMETER
Publication number
20220230861
Publication date
Jul 21, 2022
SHIMADZU CORPORATION
Hidenori TAKAHASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION ANALYZER
Publication number
20220157586
Publication date
May 19, 2022
SHIMADZU CORPORATION
Hidenori TAKAHASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION ANALYZER
Publication number
20220115225
Publication date
Apr 14, 2022
SHIMADZU CORPORATION
Hidenori TAKAHASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTROMETRY DATA ANALYSIS DEVICE, MASS SPECTROMETRY DEVICE, M...
Publication number
20210166928
Publication date
Jun 3, 2021
Shimadzu Corporation
Hidenori TAKAHASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTROMETRY METHOD AND MASS SPECTROMETER
Publication number
20210050198
Publication date
Feb 18, 2021
SHIMADZU CORPORATION
Hidenori TAKAHASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION ANALYZER
Publication number
20200111654
Publication date
Apr 9, 2020
SHIMADZU CORPORATION
Hidenori TAKAHASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION ANALYSIS DEVICE AND ION DISSOCIATION METHOD
Publication number
20200035478
Publication date
Jan 30, 2020
Shimadzu Corporation
Hidenori TAKAHASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ANALYTICAL DEVICE
Publication number
20190333748
Publication date
Oct 31, 2019
Shimadzu Corporation
Hidenori TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR ANALYZING PROTEIN OR PEPTIDE
Publication number
20190195887
Publication date
Jun 27, 2019
Shimadzu Corporation
Sadanori SEKIYA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION TRAP MASS SPECTROMETRY DEVICE AND MASS SPECTROMETRY METHOD USIN...
Publication number
20190108993
Publication date
Apr 11, 2019
SHIMADZU CORPORATION
Sadanori SEKIYA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ANALYSIS METHOD AND ANALYTICAL DEVICE
Publication number
20190088459
Publication date
Mar 21, 2019
Shimadzu Corporation
Hidenori TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
LIPID-ANALYZING METHOD USING MASS SPECTROMETRY AND MASS SPECTROMETER
Publication number
20190004071
Publication date
Jan 3, 2019
Shimadzu Corporation
Hidenori TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
ION ANALYZER
Publication number
20160372311
Publication date
Dec 22, 2016
SHIMADZU CORPORATION
Hidenori TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRIC METHOD
Publication number
20140224973
Publication date
Aug 14, 2014
SHIMADZU CORPORATION
Sadanori Sekiya
G01 - MEASURING TESTING